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HCS244MS - Radiation Hardened Octal Buffer/Line Driver/ Three-State

Datasheet Summary

Description

The Intersil HCS244MS is a Radiation Hardened NonInverting Octal Buffer/Line Driver, Three-State, with two active-low output enables.

The HCS244MS utilizes advanced CMOS/SOS technology to achieve high-speed operation.

This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family.

Features

  • 3 Micron Radiation Hardened CMOS SOS.
  • Total Dose 200K RAD (Si)/s.
  • SEP Effective LET No Upsets: >100 MEV-cm2/mg.
  • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ).
  • Dose Rate Survivability: >1 x 1012 RAD (Si)/s.
  • Dose Rate Upset >10 10 19 2 OE 18 1 Y0 17 2 A3 16 1 Y1 15 2 A2 14 1 Y2 13 2 A1 12 1 Y3 11 2 A0 RAD (Si)/s 20ns Pulse.
  • Latch-Up Free Under Any Conditions.
  • Fanout (Over Temperature Range) - Bus Drive.

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Datasheet preview – HCS244MS

Datasheet Details

Part number HCS244MS
Manufacturer Intersil Corporation
File Size 173.26 KB
Description Radiation Hardened Octal Buffer/Line Driver/ Three-State
Datasheet download datasheet HCS244MS Datasheet
Additional preview pages of the HCS244MS datasheet.

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Full PDF Text Transcription

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HCS244MS September 1995 Radiation Hardened Octal Buffer/Line Driver, Three-State Pinouts 20 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T20 TOP VIEW OE 1 A0 1 Y3 2 A1 1 Y2 2 A2 1 Y1 2 1 2 3 4 5 6 7 8 9 10 20 VCC Features • 3 Micron Radiation Hardened CMOS SOS • Total Dose 200K RAD (Si)/s • SEP Effective LET No Upsets: >100 MEV-cm2/mg • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) • Dose Rate Survivability: >1 x 1012 RAD (Si)/s • Dose Rate Upset >10 10 19 2 OE 18 1 Y0 17 2 A3 16 1 Y1 15 2 A2 14 1 Y2 13 2 A1 12 1 Y3 11 2 A0 RAD (Si)/s 20ns Pulse • Latch-Up Free Under Any Conditions • Fanout (Over Temperature Range) - Bus Driver Outputs - 15 LSTTL Loads • Military Temperature Range: -55oC to +125oC • Significant Power Reduction Compared to
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