Download IRLI510A Datasheet PDF
Fairchild Semiconductor
IRLI510A
FEATURES - Avalanche Rugged Technology - Rugged Gate Oxide Technology - Lower Input Capacitance - Improved Gate Charge - Extended Safe Operating Area - 175° C Operating Temperature - Lower Leakage Current: 10µA (Max.) @ VDS = 100V - Lower RDS(ON): 0.336Ω (Typ.) IRLW/I510A BVDSS = 100 V RDS(on) = 0.44Ω ID = 5.6 A D2-PAK I2-PAK 1 1 3 2 3 1. Gate 2. Drain 3. Source Absolute Maximum Ratings Symbol VDSS ID IDM VGS EAS IAR EAR dv/dt PD Characteristic Drain-to-Source Voltage Continuous Drain Current (TC=25°C) Continuous Drain Current (TC=100°C) Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TA=25°C) - Total Power Dissipation (TC=25°C) Linear Derating Factor TJ , TSTG TL Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8 from case for 5-seconds (2) (1) (1) (3) (1) Value 100 5.6 4.0 20 ±20 62 5.6 3.7 6.5 3.8 37 0.25 -...