SN74ABT8245 Datasheet (Texas Instruments)

SN74ABT8245, SCAN TEST DEVICES

The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family.

This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies.

Scan access to the test ci

SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D AUGUST 1992 REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode D SCOPE ™ Instruction Set: IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and