SN54ABT18245 Datasheet - Texas Instruments

SN54ABT18245 SCAN TEST DEVICE

The SN54ABT18245 scan test device with 18-bit bus transceivers is a member of the Texas Instruments SCOPE™ testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test.

SN54ABT18245 SCAN TEST DEVICE WITH 18-BIT BUS TRANSCEIVERS SGBS307A AUGUST 1994 REVISED JANUARY 1995 Member of the Texas Instruments SCOPE ™ Family of Testability Products Member of the Texas Instruments Widebus ™ Family Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture SCOPE ™ Instruction Set IEEE Standard 1149.1-1990 Required Instructions, CLAMP and HIGHZ Paralle.

SN54ABT18245 Datasheet (410.47 KB)