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TND307 Graphical Data Test Circuits

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TND307 Graphical Data Test Circuits for the NCP1650 Prepared by Alan Ball ON Semiconductor Applications Engineering http://onsemi.com The following c.
of the procedure. 5 V Iavg Iavg fltr 10 11 1 nF 0. 5 V 0. 5 V 10 1k APPLICATION NOTE 30 k 0.

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