Click to expand full text
User’s Manual
VR4181™
64-/32-Bit Microprocessor Hardware
µPD30181
Document No. U14272EJ3V0UM00 (3rd edition) Date Published November 2002 NS CP(K) NEC Electronics Corporation 2000 MIPS Technologies, Inc. 1998 Printed in Japan
[MEMO]
2
User’s Manual U14272EJ3V0UM
NOTES FOR CMOS DEVICES
1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity.
UPD30181 Datasheet
