DS21Q59 Datasheet (Maxim Integrated Products) - RELIABILITY REPORT FOR DS21Q59/ REV A2

DS21Q59, RELIABILITY REPORT FOR DS21Q59/ REV A2

A description of this device can be found in the product data sheet.

You can find the product data sheet at http://dbserv.maxim-ic.com/l_datasheet3.cfm.

Reliability Derating: The Arrhenius model will be used to determine the acceleration factor for failure mechanisms that are temperature accelerate

02/03/2004 RELIABILITY REPORT FOR DS21Q59, Rev A2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy.

Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com ph: 972-371-3726 fax: 972-371-6016 mbl: 214-435-6610 Conclusion: The following qualification successfully meets the quality and reliability standards required of all Dallas Semiconductor products and processes: DS21Q