TMS570LC4357-SEP
Features
- VID
- V62/18621
- Radiation Hardened
- Single Event Latch-up (SEL) Immune to 43Me V-cm2/mg at 125°C
- Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 30krad (Si)
- Space Enhanced Plastic
- Controlled Baseline
- Gold Au wire
- One Assembly/Test Site
- One Fabrication Site
- Available in Extended (- 55°C to 125°C)
Temperature Range
- Extended Product Life Cycle
- Extended Product-Change Notification
- Product Traceability
- Enhanced Mold pound for Low Outgassing
- High-Performance Automotive-Grade Microcontroller for Safety-Critical Applications
- Dual-Core Lockstep CPUs With ECC-Protected Caches
- ECC on Flash and RAM Interfaces
- Built-In Self-Test (BIST) for CPU, High-End
Timers, and On-Chip RAMs
- Error Signaling Module (ESM) With Error Pin
- Voltage and Clock Monitoring
- Arm® Cortex®-R5F 32-Bit RISC CPU
- 1.66 DMIPS/MHz With 8-Stage Pipeline
- FPU With Single- and Double-Precision
- 16-Region Memory Protection Unit (MPU)
- 32KB of Instruction and 32KB of Data...
