TMS570LC4357-SEP
Overview
- VID - V62/18621
- Radiation Hardened - Single Event Latch-up (SEL) Immune to 43MeV-cm2/mg at 125°C - Total Ionizing Dose (TID) RLAT for Every Wafer Lot up to 30krad (Si)
- Space Enhanced Plastic - Controlled Baseline - Gold Au wire - One Assembly/Test Site - One Fabrication Site - Available in Extended (-55°C to 125°C) Temperature Range - Extended Product Life Cycle - Extended Product-Change Notification - Product Traceability - Enhanced Mold Compound for Low Outgassing
- High-Performance Automotive-Grade Microcontroller for Safety-Critical Applications - Dual-Core Lockstep CPUs With ECC-Protected Caches - ECC on Flash and RAM Interfaces - Built-In Self-Test (BIST) for CPU, High-End Timers, and On-Chip RAMs - Error Signaling Module (ESM) With Error Pin - Voltage and Clock Monitoring
- Arm® Cortex®-R5F 32-Bit RISC CPU - 1.66 DMIPS/MHz With 8-Stage Pipeline - FPU With Single- and Double-Precision - 16-Region Memory Protection Unit (MPU) - 32KB of Instruction and 32KB of Data Caches With ECC - Open Architecture With Third-Party Support
- Operating Conditions - Up to 300-MHz CPU Clock - Core Supply Voltage (VCC): 1.14 to 1.32V - I/O Supply Voltage (VCCIO): 3.0 to 3.6V
- Integrated Memory - 4MB of Program Flash With ECC - 512KB of RAM With ECC - 128KB of Data Flash for Emulated EEPROM With ECC
- 16-Bit External Memory Interface (EMIF)
- Hercules™ Common Platform Architecture - Consistent Memory Map Across Family - Real-Time Interrupt (RTI) Timer (OS Timer) - Two 128-Channel Vectored Interrupt Modules (VIMs) With ECC Protection on Vector Table
- VIM1 and VIM2 in Safety Lockstep Mode - Two 2-Channel Cyclic Redundancy Checker (CRC) Modules
