Datasheet Details
| Part number | TFP410-EP |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 1.17 MB |
| Description | Digital Transmitter |
| Datasheet |
 TFP410-EP Datasheet
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| Part number | TFP410-EP |
|---|---|
| Manufacturer | Texas Instruments |
| File Size | 1.17 MB |
| Description | Digital Transmitter |
| Datasheet |
TFP410-EP Datasheet
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The TFP410 is a Texas Instruments PanelBust flat panel display product, part of a comprehensive family of end-to-end digital visual interface (DVI) 1.0-compliant solutions, targeted at the PC and consumer electronics industry.
The TFP410 provides a un
TFP410-EP PanelBus™ DIGITAL TRANSMITTER SGLS344A − JULY 2006 − REVISED MAY 2011 D Controlled Baseline − One Assembly − One Test Site − One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Digital Visual Interface (DVI) Compliant(1) D Supports Pixel Rates Up to 165MHz (Including 1080p and WUXGA at 60Hz) D Universal Graphics Controller Interface − 12-Bit Dual-Edge and 24-Bit Single-Edge Input Modes − Adjustable 1.1-V to 1.8-V and Standard 3.3-V CMOS Input Signal Levels − Fully Differential and Single-Ended Input Clocking Modes − Standard Intelt 12-Bit Digital Video Port Compatible as on Intel 81x Chipsets D Enhanced PLL Noise Immunity − On-Chip Regulators and Bypass Capacitors for Reducing System Costs D Enhanced Jitter Performance − No HSYNC Jitter Anomaly − Negligible Data-Dependent Jitter D Programmable Using I2C Serial Interface D Monitor Detection Through Hot-Plug and Receiver Detection D Single 3.3-V Supply Operation D 64-Pin Thin Quad Flat Pack (TQFP) Using TI’s PowerPAD™ Package D TI Advanced 0.18-μm EPIC-5™ CMOS Process Technology D Pin Compatible With SiI164 DVI Transmitter † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
| Part Number | Description |
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