Datasheet4U Logo Datasheet4U.com

SN74LVC1G97-EP - Configurable Multiple-Function Gate

Datasheet Summary

Description

This configurable multiple-function gate is designed for 1.65-V to 5.5-V VCC operation.

Features

  • configurable multiple functions. The output state is determined by eight patterns of 3-bit input. The user can choose the logic functions MUX, AND, OR, NAND, NOR, inverter, and noninverter. All inputs can be connected to VCC or GND. This device functions as an independent gate, but because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT.
  • ) signals. This device is fully specified for partial-power-down.

📥 Download Datasheet

Datasheet preview – SN74LVC1G97-EP

Datasheet Details

Part number SN74LVC1G97-EP
Manufacturer Texas Instruments
File Size 778.45 KB
Description Configurable Multiple-Function Gate
Datasheet download datasheet SN74LVC1G97-EP Datasheet
Additional preview pages of the SN74LVC1G97-EP datasheet.

📁 Similar Datasheet

  • SN74LVC1G125 - high performance non-inverting buffer (UMW)
  • SN74LVC1G34 - Single buffer (UMW)
  • SN74L71 - AND-Gate R-S Master-Slave F-F (National Semiconductor)
  • SN74L74N - Dual D-Type Flip-Flop (ETC)
  • SN74LS00 - QUAD 2-INPUT NAND GATE (Motorola)
  • SN74LS00 - Quad 2-Input NAND Gate (ON Semiconductor)
  • SN74LS02 - QUAD 2-INPUT NOR GATE (Motorola)
  • SN74LS02 - QUAD 2-INPUT NOR GATE (ON Semiconductor)
  • SN74LS04 - Hex Inverter (ON Semiconductor)
  • SN74LS04 - HEX INVERTER (Motorola)
Other Datasheets by Texas Instruments

Full PDF Text Transcription

Click to expand full text
SN74LVC1G97ĆEP CONFIGURABLE MULTIPLEĆFUNCTION GATE D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Supports 5-V VCC Operation D Inputs Accept Voltages to 5.5 V D Max tpd of 6.3 ns at 3.3 V D Low Power Consumption, 10-µA Max ICC † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Published: |