SN74LVC1G08-EP
SN74LVC1G08-EP is Single 2-Input Positive-AND Gate manufactured by Texas Instruments.
FEATURES
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Extended Temperature Performance of
- 55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree (1)
- Supports 5-V VCC Operation
- Inputs Accept Voltages to 5.5 V
- Max tpd of 3.6 ns at 3.3 V
- Low Power Consumption, 10-µA Max ICC
- ±24-m A Output Drive at 3.3 V
(1) ponent qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold pound life. Such qualification testing should not be viewed as justifying use of this ponent beyond specified performance and environmental limits.
SN74LVC1G08-EP SINGLE 2-INPUT POSITIVE-AND GATE
SCES454C
- DECEMBER 2003
- REVISED AUGUST 2006
- Ioff Supports Partial-Power-Down Mode Operation
- Latch-Up Performance Exceeds 100 m A Per JESD 78, Class II
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
DBV OR DCK PACKAGE (TOP VIEW)
A1 B2 GND 3
5 VCC 4Y
DESCRIPTION
/ORDERING INFORMATION
The SN74LVC1G08 performs the Boolean function Y + A
- B or Y + A ) B in positive logic.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
- 40°C to 85°C
- 55°C to 125°C
ORDERING INFORMATION
PACKAGE (1)
ORDERABLE PART NUMBER
SOT (SC-70)
-...
