SN74HC10-EP - TRIPLE 3-INPUT POSITIVE-NAND GATE

Texas Instruments

General Description

The SN74HC10 device contains three independent 3-input NAND gates.

C or Y = A + B + C in positive logic.

D 40°C to 1

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SN74HC10-EP triple 3-input positive-nand gate by Texas Instruments - Datasheet Preview

Datasheet Details

Part number	SN74HC10-EP
Manufacturer	Texas Instruments
File Size	856.79 KB
Description	TRIPLE 3-INPUT POSITIVE-NAND GATE
Datasheet	SN74HC10-EP Datasheet

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The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

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SN74HC10ĆEP TRIPLE 3ĆINPUT POSITIVEĆNAND GATE D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −40°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Wide Operating Voltage Range of 2 V to 6 V † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.