Datasheet4U Logo Datasheet4U.com

SN74HC02-EP - QUADRUPLE 2-INPUT POSITIVE-NOR GATE

Description

The SN74HC02 contains four independent 2-input NOR gates.

B in positive logic.

40°C to 125°C TSSOP PW Tape and reel SN7

📥 Download Datasheet

Datasheet preview – SN74HC02-EP

Datasheet Details

Part number SN74HC02-EP
Manufacturer Texas Instruments
File Size 492.81 KB
Description QUADRUPLE 2-INPUT POSITIVE-NOR GATE
Datasheet download datasheet SN74HC02-EP Datasheet
Additional preview pages of the SN74HC02-EP datasheet.

📁 Similar Datasheet

  • SN74HC06 - Hex Inverter (Lingxing Microelectronics)
  • SN74HC182 - FUNCTION LOOK AHEAD CARRY GENERATOR (ST Microelectronics)
  • SN74HC423 - DUAL RETRIGGERABLE MONOSTABLE MULTIVIBRATOR (ST Microelectronics)
  • SN74HCT06 - Hex Inverter (Lingxing Microelectronics)
  • SN74H74N - Dual D-Type Flip-Flop (ETC)
  • SN74101 - AND-OR Gate (ETC)
  • SN74102 - AND Gate (ETC)
  • SN74103 - Dual J-K Flip-Flop (ETC)
  • SN74106 - Dual J-K Flip-Flop (ETC)
  • SN74108 - Dual J-K Flip Flop (ETC)
Other Datasheets by Texas Instruments
  • SN74HC02-Q1 - QUADRUPLE 2-INPUT POSITIVE-NOR GATE
  • SN74HC02 - Quadruple 2-Input Positive-NOR Gates
  • SN74HC02D - Quadruple 2-Input Positive-NOR Gates
  • SN74HC02N - Quadruple 2-Input Positive-NOR Gates
  • SN74HC00 - Quadruple 2-Input Positive-NAND Gates
  • SN74HC00-Q1 - QUADRUPLE 2-INPUT POSITIVE-NAND GATE
  • SN74HC00D - Quadruple 2-Input Positive-NAND Gates
  • SN74HC00N - Quadruple 2-Input Positive-NAND Gates

Full PDF Text Transcription

Click to expand full text
SN74HC02ĆEP QUADRUPLE 2ĆINPUT POSITIVEĆNOR GATE D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of Up To −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D 2-V to 6-V VCC Operation † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.
Published: |