Datasheet4U Logo Datasheet4U.com

SN74AHC1G02-EP - Positive-NOR Gate

Description

ORDERING INFORMATION This device contains a single 2-input NOR gate that performs the Boolean function Y = A

B or Y = A + B in positive logic.

55°C to 125°C PACKAGE (2) SOT (SC-70) - DCK Reel of 3000 ORDERABLE PART NUMBER SN74AHC1G02MDCKREP TOP-SI

Features

  • 1.
  • Controlled Baseline.
  • One Assembly Site.
  • One Test Site.
  • One Fabrication Site.
  • Extended Temperature Performance of.
  • 55°C to 125°C.
  • Enhanced Diminishing Manufacturing Sources (DMS) Support.
  • Enhanced Product-Change Notification.
  • Qualification Pedigree (1) (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is no.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
SN74101 AND-OR Gate ETC
SN74102 AND Gate ETC
SN74103 Dual J-K Flip-Flop ETC
SN74106 Dual J-K Flip-Flop ETC
SN74108 Dual J-K Flip Flop ETC

Other Datasheets by Texas Instruments

Part Number Description
SN74AHC1G02 Positive-NOR Gate
SN74AHC1G00 Positive-NAND Gate
SN74AHC1G00-Q1 Positive-NAND Gate
SN74AHC1G04 Single Inverter Gate
SN74AHC1G04-Q1 Automotive Single Inverter Gate

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
www.ti.com SN74AHC1G02-EP SINGLE 2-INPUT POSITIVE-NOR GATE SCLS708 – FEBRUARY 2008 FEATURES 1 • Controlled Baseline – One Assembly Site – One Test Site – One Fabrication Site • Extended Temperature Performance of –55°C to 125°C • Enhanced Diminishing Manufacturing Sources (DMS) Support • Enhanced Product-Change Notification • Qualification Pedigree (1) (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life.