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SN74ABT18646 Datasheet, Texas Instruments

SN74ABT18646 device equivalent, scan test device.

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SN74ABT18646 Datasheet

Application

of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Wi.

Description

This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Sca.

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TAGS

SN74ABT18646
SCAN
TEST
DEVICE
SN74ABT18640
SN74ABT18652
SN74ABT18245A
Texas Instruments

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