logo

SN54ABT8245 Datasheet, Texas Instruments

SN54ABT8245 devices equivalent, scan test devices.

SN54ABT8245 Avg. rating / M : 1.0 rating-13

datasheet Download (Size : 1.11MB)

SN54ABT8245 Datasheet

Application

of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and EP.

Description

The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ci.

Image gallery

SN54ABT8245 Page 1 SN54ABT8245 Page 2 SN54ABT8245 Page 3

TAGS

SN54ABT8245
SCAN
TEST
DEVICES
Texas Instruments

Since 2006. D4U Semicon.   |   Contact Us   |   Privacy Policy   |   Purchase of parts