SN54ABT8245 devices equivalent, scan test devices.
of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EP.
The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex ci.
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