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Texas Instruments (TI) Electronic Components Datasheet

SN74BCT8373 Datasheet

Scan Test Device

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Member of the Texas Instruments SCOPE
Family of Testability Products
Octal Test-Integrated Circuit
Functionally Equivalent to SN74F373 and
SN74BCT373 in the Normal-Function Mode
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Test Operation Synchronous to Test
Access Port (TAP)
Implements Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage
(10 V ) on TMS Pin
SCOPE Instruction Set
− IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP
and HIGHZ
− Parallel-Signature Analysis at Inputs
− Pseudo-Random Pattern Generation
From Outputs
− Sample Inputs/ Toggle Outputs
Package Options Include Plastic
Small-Outline (DW) Packages and
Standard Plastic 300-mil DIPs (NT)
SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DĆTYPE LATCHES
SCBS471 − JUNE 1990 − REVISED JUNE 1994
DW OR NT PACKAGE
(TOP VIEW)
LE
1Q
2Q
3Q
4Q
GND
5Q
6Q
7Q
8Q
TDO
TMS
1
2
3
4
5
6
7
8
9
10
11
12
24 OE
23 1D
22 2D
21 3D
20 4D
19 5D
18 VCC
17 6D
16 7D
15 8D
14 TDI
13 TCK
description
The SN74BCT8373 scan test device with octal D-type latches is a member of the Texas Instruments SCOPE
testability integrated circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan
to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via
the 4-wire test access port (TAP) interface.
In the normal mode, this device is functionally equivalent to the SN74F373 and SN74BCT373 octal D-type
latches. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the
device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPEoctal latches.
In the test mode, the normal operation of the SCOPEoctal latches is inhibited and the test circuitry is enabled
to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform
boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test terminals control the operation of the test circuitry: test data input (TDI), test data output
(TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN74BCT8373 is characterized for operation from 0°C to 70°C.
SCOPE is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 1994, Texas Instruments Incorporated
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443
2−1


Texas Instruments (TI) Electronic Components Datasheet

SN74BCT8373 Datasheet

Scan Test Device

No Preview Available !

SN74BCT8373
SCAN TEST DEVICE
WITH OCTAL DĆTYPE LATCHES
SCBS471 − JUNE 1990 − REVISED JUNE 1994
FUNCTION TABLE
(normal mode, each latch)
INPUTS
OE LE
D
OUTPUT
Q
L HH
H
LHL
L
LLX
HXX
Q0
Z
logic symbol
TDI
TMS
TCK
14
12
13
24
OE
1
LE
23
1D
22
2D
21
3D
20
4D
19
5D
17
6D
16
7D
15
8D
Φ
SCAN
SN74BCT8373
TDI
TMS
TDO
TCK-IN
TCK-OUT
EN
C1
1D
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
11
TDO
2
1Q
3
2Q
4
3Q
5
4Q
7
5Q
8
6Q
9
7Q
10
8Q
2−2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443


Part Number SN74BCT8373
Description Scan Test Device
Maker Texas
Total Page 21 Pages
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