Datasheet4U Logo Datasheet4U.com

CS1124 - Dual Variable-Reluctance Sensor Interface IC

Description

br> www.DataSheet4U.com PACKAGE PIN # SO

8 1 2 3 4 5 6 7 8 PIN SYMBOL INAdj IN1 IN2 GND DIAG OUT2 OUT1 VCC FUNCTION External resistor to ground that sets the trip levels of both channels.

Functions for both diagnostic and normal mode.

Input to channel 1.

Features

  • es Dual Channel Capability Built.
  • In Test Mode On.
  • Chip Input Voltage Clamping Works from 5.0 V Supply Accurate Built.
  • In Hysteresis VCC PIN.

📥 Download Datasheet

Datasheet Details

Part number CS1124
Manufacturer onsemi
File Size 117.51 KB
Description Dual Variable-Reluctance Sensor Interface IC
Datasheet download datasheet CS1124 Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
CS11-E2GA222MYNS Disk Ceramic Capacitors TDK
CS1100L Current Sensors Coilcraft
CS1101 DIMENSIONS SCHEMATIC & PC LAYOUT CIT Relay
CS1102 CIT SWITCH ETC
CS1107 Single Relay Driver Cherry Semiconductor Corporation

Other Datasheets by onsemi

Part Number Description
CS1107 Single Relay Driver
CS1108 Single Lamp Driver
CS1112 Quad Power Output Driver
CS1087 Vacuum Fluorescent Display Tube Driver
CS1088 Vacuum Fluorescent Display Tube Driver

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
www.DataSheet4U.com CS1124 Dual Variable-Reluctance Sensor Interface IC The CS1124 is a monolithic integrated circuit designed primarily to condition signals used to monitor rotating parts. The CS1124 is a dual channel device. Each channel interfaces to a Variable Reluctance Sensor, and monitors the signal produced when a metal object is moved past that sensor. An output is generated that is a comparison of the input voltage and the voltage produced at the IN Adj lead. The resulting square–wave is available at the OUT pin. When the DIAG pin is high, the reference voltage at INAdj is increased. This then requires a larger signal at the input to trip the comparator, and provides for a procedure to test for an open sensor. http://onsemi.
Published: |