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MN54AC244-X Datasheet National Semiconductor

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SECTION Processing MIL-STD-883, Method 5004 Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Function.

MN54AC244-X MN54AC244-X MN54AC244-X
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