UPD78F0544 Datasheet | NEC

.. User’s Manual 78K0/KF2 8-Bit Single-Chip Microcontrollers µPD78F0544 µPD78F0545 µPD78F0546 µPD78F0547 µPD78F0547D µPD78F0544(A) µPD78F0545(A) µPD78F0546(A) µPD78F0547(A) The µPD78F0547D has an on-chip debug function. Do not use this product for mass production because its reliability cannot be guaranteed after the on-chip debug function has been used, due to issues with respect to the number of times the flash memory can be rewritten. NEC Electronics does not accept plaints concerning this product. Document No. U17397EJ4V0UD00 (4th edition) Date Published May 2006 NS CP(K) 2005 Printed in Japan .. [MEMO] User’s Manual U17397EJ4V0UD .. NOTES FOR CMOS DEVICES VOLTAGE APPLICATION WAVEFORM AT INPUT PIN Waveform distortion due to input noise or a reflected wave may cause malfunction. If the input of the CMOS device stays in the area between VIL (MAX) and VIH (MIN) due to noise, etc., the device may malfunction. Take care to prevent chattering noise from entering the device when the input level is fixed, and also in the transition period when the input level passes through the area between VIL (MAX) and VIH (MIN). HANDLING OF UNUSED INPUT PINS Unconnected CMOS device inputs can be cause of malfunction. If an input pin is unconnected, it is possible that an internal input level may be generated due to noise, etc., causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using pull-up or pull-down circuitry. Each unused pin should be connected to VDD or GND via a resistor if there is a possibility that it will be an output pin. All handling related to unused pins must be judged separately for each device and according to related specifications governing the device. PRECAUTION AGAINST ESD A strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the...