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D780054 - UPD780054

Download the D780054 datasheet PDF. This datasheet also covers the D78F0058 variant, as both devices belong to the same upd780054 family and are provided as variant models within a single manufacturer datasheet.

Description

of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples.

Features

  • NEC Electronics products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to NEC Electronics products developed based on a customerdesignated "quality assurance program" for a specific.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (D78F0058-NEC.pdf) that lists specifications for multiple related part numbers.

Datasheet Details

Part number D780054
Manufacturer NEC
File Size 3.49 MB
Description UPD780054
Datasheet download datasheet D780054 Datasheet

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Other Datasheets by NEC

Part Number Description
D780053 UPD780053
D780055 UPD780055
D780056 UPD780056
D780058 UPD780058
D780016YGF022 UPD780016Y

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
User’s Manual µPD780058, 780058Y Subseries 8-Bit Single-Chip Microcontrollers µPD780053 µPD780053Y µPD780054 µPD780054Y µPD780055 µPD780055Y µPD780056 µPD780056Y µPD780058 µPD780058BY µPD780058B µPD78F0058Y µPD78F0058 µPD780053Y(A) µPD780053(A) µPD780054Y(A) µPD780054(A) µPD780055Y(A) µPD780055(A) µPD780056Y(A) µPD780056(A) µPD780058BY(A) µPD780058B(A) Document No. U12013EJ3V2UD00 (3rd edition) Date Published February 2003 N CP (K) Printed in Japan 1997, 2003 [MEMO] 2 User's Manual U12013EJ3V2UD NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation.