78F0547 Overview
Do not use this product for mass production because its reliability cannot be guaranteed after the on-chip debug function has been used, due to issues with respect to the number of times the flash memory can be rewritten. NEC Electronics does not accept plaints concerning this product. U17397EJ4V0UD00 (4th edition) Date Published May 2006 NS CP(K) 2005 Printed in Japan.
