Description
Maxwell Technologies’ 28C256T high density 256k-bit EEPROM microcircuit
Features
RAD-PAK® radiation-hardened against natural space radiation.
Total dose hardness: - > 100 Krad (Si), dependent upon space mission.
Excellent Single Event Effects: - SELTH LET: > 120 MeV/mg/cm2 - SEUTH LET (read mode): > 90 MeV/mg/cm2 - SEUTH LET (write mode): > 18 MeV/mg/cm2.
Package: - 28 pin RAD-PAK® flat pack - 28 pin RAD-PAK® DIP - JEDEC approved byte wide pinout.
High Speed: - 120, 150 ns maximum access times available.
High endurance:.
Datasheet Details
Part number
28C256T
Manufacturer
Maxwell Technologies
File Size
316.82 KB
Description
256K EEPROM (32K x 8-Bit) EEPROM
Datasheet
28C256T Datasheet
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Full PDF Text Transcription (Reference)
The following content is an automatically extracted verbatim text
from the original manufacturer datasheet and is provided for reference purposes only.
View original datasheet text
28C256T
256K EEPROM (32K x 8-Bit) EEPROM
VCC GND DATA INPUTS/OUTPUTS I/O0 - I/O7
OE WE CE OE, CE, and WE LOGIC
DATA LATCH INPUT/OUTPUT BUFFERS Y-GATING CELL MATRIX
www.DataSheet4U.
Published:
Dec 13, 2008
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