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IQXO-618-25 Datasheet Preview

IQXO-618-25 Datasheet

Crystal Clock Oscillator

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ISSUE 1; June 2018
Description
LVDS output crystal oscillator in a hermetically sealed ceramic
package with a seam sealed metal lid.
Frequency Parameters
Frequency
Frequency Stability
Ageing
100.0MHz to 125.0MHz
±30.00ppm to ±70.00ppm
±3ppm max per year at 25°C
Electrical Parameters
Supply Voltage
Start-Up Time: 10ms max
2.5V ±5%
Operating Temperature Ranges
-40 to 105°C
-40 to 125°C
Output Details
Output Compatibility
LVDS
Drive Capability
100
Differential Output Voltage (VoD): 0.25V min, 0.45V max
Offset Voltage (VOS): 1.125V min, 1.250V typ, 1.375V max.
Output Voltage Levels:
Output Low (VoL): 0.9V min
Output High (VoH): 1.6V max
Output Control
Enable/Disable:
Logic ‘1’ (70% Vs) to pad 1 enables oscillator output.
Logic ‘0’ (30% Vs) to pad 1 disables oscillator output; when
disabled the oscillator output goes to the high impedance
state.
No connection to pad 1 enables oscillator output.
Standby Current: 10µA max
Output Enable Delay Time: 2ms max
Output Disable Delay Time: 200ns max
Noise Parameters
Phase Jitter (12kHz to 20MHz): 1ps rms max
Crystal Clock Oscillator Specification
IQXO-618-25
Outline (mm)




IQD

IQXO-618-25 Datasheet Preview

IQXO-618-25 Datasheet

Crystal Clock Oscillator

No Preview Available !

Crystal Clock Oscillator Specification
IQXO-618-25
ISSUE 1; June 2018
Environmental Parameters
Storage Temperature Range: -55 to 125°C
Drop Test (JIS-C0044): the specimen is measured for
frequency before the test. It is then dropped from a height of
100cm min as a free fall object onto a hard wooden plate of
thickness 30mm min.
Vibration (MIL-STD-883F : 2007.3): the specimen is measured
for frequency before the test. Test in X,Y and Z axes for the
vibration test. Frequency range: 20~2000Hz, peak to peak
amplitude: 1.52mm, peak acceleration: 20G, sweep time: 20
minute/axis, pendicular total test time: 4 hours.
Low Temp Exposure (JIS-C0020): the specimen is measured
for frequency before the test. Expose device to -40°C±3°C for
168±6 hours. Measure electrical performance after leaving
1~2 hours at room temperature.
Ageing Test (JIS-C0021): the specimen is measured for
frequency before the test. Expose device to +125°C±3°C for
720±48 hours. Measure electrical performance after leaving
1~2 hours at room temperature.
High Temperature and Humidity (MIL-STD-883F : 1004.7): the
specimen is measured for frequency before the test. Expose
device to +85°C±5°C and 85±5% humidity for 168±6 hours.
Measure electrical performance after leaving 1~2 hours at
room temperature.
Temperature Cycle Test (MIL-STD-883F : 1010.8): the
specimen is measured for frequency before the test. Expose
device to 100 cycles of:
Low temp: -55°C±3°C for15±3 min
Ramp up to high temp: 2-3 mins
High temp:+125°C±3°C for15±3 min
Ramp down to low temp: 2-3 mins
Measure electrical performance after leaving 1~2 hours at
room temperature.
Compliance
RoHS Status (2011/65/EU)
REACh Status
MSL Rating (JDEC-STD-033):
Compliant
Compliant
Not Applicable
Packaging Details
Pack Style: Bulk
Pack Size: 100
Pack Style: Reel
Pack Size: 1,000
Loose in bulk pack
Tape & reel in accordance with EIA-481-D
Electrical Specification - maximum limiting values 2.50V ±5%
Frequency
Temperature Range
Stability
Min
Current
Draw
Rise and Fall
Time
Duty Cycle
°C
ppm mA
ns
%
100.0MHz
-40 to 105
±30.00
40
1
45/55%
-40 to 125
±70.00
40
1
45/55%
125.0MHz
-40 to 105
±50.00
40
1
45/55%
This document was correct at the time of printing; please contact your local sales office for the latest version.
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Part Number IQXO-618-25
Description Crystal Clock Oscillator
Maker IQD
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IQXO-618-25 Datasheet PDF






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