Datasheet4U Logo Datasheet4U.com

HY51V18163HGT - 1M x 16Bit EDO DRAM

Description

The HY51V(S)18163HG/HGL is the new generation dynamic RAM organized 1,048,576 words x 16bit.

HY51V(S)18163HG/HGL has realized higher density, higher performance and various functions by utilizing advanced CMOS process technology.

Features

  • Extended Data Out Mode capability Read-modify-write capability Multi-bit parallel test capability TTL(3.3V) compatible inputs and outputs /RAS only, CAS-before-/RAS, Hidden and self refresh(L-version) capability Fast access time and cycle time Part No HY51V(S)18163HG/HGL-5 HY51V(S)18163HG/HGL-6 HY51V(S)18163HG/HGL-7 tRAC 50ns 60ns 70ns.
  • JEDEC standard pinout 42pin plastic SOJ / 44(50)pin TSOP-II.

📥 Download Datasheet

📁 Similar Datasheet

Part Number Description Manufacturer
HY5100 2 Input / 3 Output Digital Delay Line Hytek
HY510N PC POWER SUPPLY SUPERVISOR HawYang
HY5110A N-Channel Enhancement Mode MOSFET HUAYI
HY5110NA2W N-Channel Enhancement Mode MOSFET HUAYI
HY5110W N-Channel Enhancement Mode MOSFET HUAYI

Other Datasheets by SK Hynix

Part Number Description
HY51V18163HGT-5 1M x 16Bit EDO DRAM
HY51V18163HGT-6 1M x 16Bit EDO DRAM
HY51V18163HGT-7 1M x 16Bit EDO DRAM
HY51V18163HGJ 1M x 16Bit EDO DRAM
HY51V18163HGJ-5 1M x 16Bit EDO DRAM

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
HY51V(S)18163HG/HGL 1M x 16Bit EDO DRAM PRELIMINARY DESCRIPTION The HY51V(S)18163HG/HGL is the new generation dynamic RAM organized 1,048,576 words x 16bit. HY51V(S)18163HG/HGL has realized higher density, higher performance and various functions by utilizing advanced CMOS process technology. The HY51V(S)18163HG/HGL offers Extended Data Out PageMode as a high speed access mode. Multiplexed address inputs permit the HY51V(S)18163HG/HGL to be packaged in standard 400mil 42pin SOJ and 44(50) pin TSOP-II. The package size provides high system bit densities and is compatible with widely available automated testing and insertion equipment. FEATURES • • • • • Extended Data Out Mode capability Read-modify-write capability Multi-bit parallel test capability TTL(3.