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PRELIMINARY
CY7C1512
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on VCC to Relative GND[1] .... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State[1] .....................................–0.5V to VCC +0.5V
DC Input Voltage[1]..................................–0.5V to VCC +0.5V
Electrical Characteristics Over the Operating Range[3]
Current into Outputs (LOW) ........................................ 20 mA
Static Discharge Voltage ........................................... >2001V
(per MIL–STD–883, Method 3015)
Latch-Up Current ..................................................... >200 mA
Operating Range
Range
Commercial
Industrial
Ambient
Temperature[2]
0°C to +70°C
–40°C to +85°C
VCC
5V ± 10%
5V ± 10%
7C1512-15 7C1512-20 7C1512-25
Parameter
Description
Test Conditions
Min. Max. Min. Max. Min. Max. Unit
VOH
VOL
VIH
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VIL
IIX
IOZ
IOS
ICC
ISB1
ISB2
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Input LOW Voltage[1]
VCC = Min., IOH = –4.0 mA
VCC = Min., IOL = 8.0 mA
2.4 2.4 2.4
0.4 0.4 0.4
2.2 VCC+ 2.2 VCC+ 2.2 VCC+
0.3 0.3 0.3
–0.3 0.8 –0.3 0.8 –0.3 0.8
Input Load Current
GND < VI < VCC
–1 +1 –1 +1 –1 +1
Output Leakage Current
GND < VI < VCC,Output Disabled –5 +5 –5 +5 –5 +5
Output Short Circuit Current[4] VCC = Max., VOUT = GND
–300
–300
–300
VCC Operating
Supply Current
VCC = Max., IOUT = 0 mA,
f = fMAX = 1/tRC
140 130 120
Automatic CE
Max. VCCD, CatEa1S>hVeeIHt4oUr .com 40 30 30
Power–Down Current
CE2 < VIL, VIN > VIH or VIN < VIL,
— TTL Inputs
f = fMAX
Automatic CE
Max. VCC, CE1 > VCC – 0.3V, 5 5 5
Power–Down Current
or CE2 < 0.3V, VIN > VCC – 0.3V,
— CMOS Inputs
or VIN < 0.3V, f=0
V
V
V
V
µA
µA
mA
mA
mA
mA
7C1512-35
7C1512-70
Parameter
Description
Test Conditions
Min. Max. Min. Max. Unit
VOH
Output HIGH Voltage
VCC = Min., IOH = –4.0 mA
2.4
2.4
V
VOL
Output LOW Voltage
VCC = Min., IOL = 8.0 mA
0.4 0.4 V
VIH Input HIGH Voltage
VIL Input LOW Voltage[1]
2.2 VCC+ 0.3 2.2 VCC+ 0.3
–0.3 0.8 –0.3 0.8
V
V
IIX
Input Load Current
GND < VI < VCC
–1 +1 –1 +1 µA
IOZ Output Leakage Current GND < VI < VCC, Output Disabled –5 +5 –5 +5 µA
IOS
Output Short
Circuit Current[4]
VCC = Max., VOUT = GND
–300
–300
mA
ICC VCC Operating
Supply Current
VCC = Max., IOUT = 0 mA,
f = fMAX = 1/tRC
ISB1 Automatic CE
Max. VCC, CE1 > VIH or CE2 < VIL,
Power-Down Current
VIN > VIH or VIN < VIL, f = fMAX
— TTL Inputs
110 110 mA
25 25 mA
ISB2 Automatic CE
Max. VCC, CE1 > VCC – 0.3V, or CE2 <
Power-Down Current
0.3V, VIN > VCC – 0.3V, or VIN < 0.3V, f=0
— CMOS Inputs
5
5 mA
Notes:
1. VIL (min.) = -2.0V for pulse durations of less than 20 ns.
2. TA is the “instant on” case temperature.
3. See the last page of this specification for Group A subgroup testing information.
DataSheet4U4..coNmot more than one output should be shorted at one time. Duration of the short circuit should not exceed 30 seconds.
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