SLES021 − NOVEMBER 2001
24ĆBIT, 192ĆkHz SAMPLING ADVANCED SEGMENT, AUDIO
STEREO DIGITALĆTOĆANALOG CONVERTER
D 24-Bit Resolution
D Analog Performance (VCC = 5 V):
− Dynamic Range: 117 dB (Typically)
− SNR: 117 dB (Typically)
− THD+N: 0.0004% (Typically)
− Full-Scale Output (At Post Amp): 2.2-Vrms
D Differential Current Output: ±2.48 mA
D 8× Oversampling Digital Filter:
− Stop-Band Attenuation: −82 dB
− Pass-Band Ripple: ±0.002 dB
D Sampling Frequency of 10 kHz to 200 kHz
D System Clock: 128, 192, 256, 384, 512, or
768 fS With Auto Detect
D Accepts 16-, 20-, and 24-Bit Audio Data
D Data Formats: Standard, I2S, and
D Digital De-Emphasis
D Soft Mute
D Zero Flags for Each Output
D Dual Supply Operation:
− 5 V for Analog
− 3.3 V for Digital
D 5-V Tolerant Digital Inputs
D Small 28-Lead SSOP Package
D A/V Receivers
D DVD Movie Players
D SACD Player
D HDTV Receivers
D Car Audio Systems
D Digital Multi-Track Recorders
D Other Applications Requiring 24-Bit Audio
The PCM1730 is a CMOS, monolithic integrated circuit
that includes stereo digital-to-analog converters and
support circuitry in a small 28-lead SSOP package. The
data converters utilize Texas Instruments’ advanced
segment DAC architecture to achieve excellent
dynamic performance and improved tolerance to clock
jitter. The PCM1730 provides balanced current outputs,
allowing the user to optimize analog performance
externally. Sampling rates up to 200 kHz are supported.
PCM1730E 28-Lead SSOP 28DB
–25°C to 85°C
† Models with a slash (/) are available only in tape and reel in the quantities indicated (e.g., /2K indicates 2000
devices per reel). Ordering 2000 pieces of PCM1730E/2K will get a single 2000-piece tape and reel.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright 2001, Texas Instruments Incorporated