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UT7C139 - (UT7C138 / UT7C139) 4Kx8/9 Radiation-Hardened Dual-Port Static RAM

Download the UT7C139 datasheet PDF. This datasheet also covers the UT7C138 variant, as both devices belong to the same (ut7c138 / ut7c139) 4kx8/9 radiation-hardened dual-port static ram family and are provided as variant models within a single manufacturer datasheet.

General Description

The UT7C138/139 consists of an array of 4K words of 8 or 9 bits of dual-port SRAM cells, I/O and address lines, and control signals (CE, OE, R/W).

These control pins permit independent access for reads or writes to any location in memory.

Key Features

  • q 45ns and 55ns maximum address access time q Asynchronous operation for compatibility with industrystandard 4K x 8/9 dual-port static RAM www. DataSheet4U. com q CMOS compatible inputs, TTL/CMOS compatible output levels q Three-state bidirectional data bus q Low operating and standby current q Radiation-hardened process and design; total dose irradiation testing to MIL-STD-883 Method 1019 - Total-dose: 1.0E6 rads(Si) - Memory Cell LET threshold: 85 MeV-cm2 /mg q q - Latchup immune (LET >100 MeV-c.

📥 Download Datasheet

Note: The manufacturer provides a single datasheet file (UT7C138_AeroflexCircuitTechnology.pdf) that lists specifications for multiple related part numbers.

Datasheet Details

Part number UT7C139
Manufacturer Aeroflex Circuit Technology
File Size 314.55 KB
Description (UT7C138 / UT7C139) 4Kx8/9 Radiation-Hardened Dual-Port Static RAM
Datasheet download datasheet UT7C139 Datasheet

Full PDF Text Transcription (Reference)

The following content is an automatically extracted verbatim text from the original manufacturer datasheet and is provided for reference purposes only.

View original datasheet text
Standard Products UT7C138/139 4Kx8/9 Radiation-Hardened Dual-Port Static RAM with Busy Flag Data Sheet January 2002 FEATURES q 45ns and 55ns maximum address access time q Asynchronous operation for compatibility with industrystandard 4K x 8/9 dual-port static RAM www.DataSheet4U.com q CMOS compatible inputs, TTL/CMOS compatible output levels q Three-state bidirectional data bus q Low operating and standby current q Radiation-hardened process and design; total dose irradiation testing to MIL-STD-883 Method 1019 - Total-dose: 1.