| Part Number | SN74ABT18640 |
| Manufacturer | Texas Instruments (https://www.ti.com/) |
| Title | SCAN TEST DEVICE |
| Description | The ’ABT18640 scan test devices with 18-bit inverting bus transceivers are members of the Texas Instruments SCOPE™ testability integrated-circuit ... |
| Features |
s SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test a...
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| Datasheet |
 SN74ABT18640 Datasheet
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