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Part Number |
SSS4N80AS |
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Manufacturer |
Fairchild Semiconductor |
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Semiconductor DataSheet |
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DataSheet View |
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Advanced Power MOSFET
FEATURES
Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area Lower Leakage Current : 25 µA (Max.) @ VDS = 800V Low RDS(ON) : 2.450 Ω (Typ.)
SSS4N80AS
BVDSS = 800 V RDS(on) = 3.0 Ω ID = 2.8 A
TO-220F
1
2
3
1.Gate 2. Drain 3. Source
Absolute Maximum Ratings
Symbol VDSS ID IDM VGS EAS IAR EAR dv/dt PD TJ , TSTG TL Characteristic Drain-to-Source Voltage Continuous Drain Current (TC=25 C) Continuous Drain Current (TC=100 C) Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TC=25 C) Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8“ from case for 5-seconds
Ο Ο Ο
Value 800 2.8 1.8
1 O
Units V A A V mJ A mJ V/ns W W/ C
Ο
18 + 30 _ 314 2.8 4 2.0 40 0.32 - 55 to +150
Ο
O 1 O 1 O 3 O
2
C
300
Thermal Resistance
Symbol R R
θJC θJA
Characteristic Junction-to-Case Junction-to-Ambient
Typ. ---
Max. 3.13 62.5
Units
Ο
C/W
Rev. B
©1999 Fairchild Semiconductor Corporation
SSS4N80AS
Ο
N-CHANNEL POWER MOSFET
Electrical Characteristics (TC=25 C unless otherwise specified)
Symbol BVDSS ∆BV/∆TJ VGS(th) IGSS IDSS RDS(on) gfs Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Characteristic Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff. Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse Drain-to-Source Leakage Current Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain(“Miller”) Charge Min. Typ. Max. Units 800 -2.0 -----------------0.96 ------2.75 90 35 19 32 67 32 40 7.3 18.1 --3.5 100 -100 25 250 3.0 -105 42 50 75 145 75 52 --nC ns µA Ω Ω pF V V/ C V nA
Ο
Test Condition VGS=0V,ID=250µA ID=250µA VGS=30V VGS=-30V VDS=800V VDS=640V,TC=125 C VGS=10V,ID=0.85A VDS=50V,ID=0.85A
4 O* 4 O
Ο
See Fig 7
VDS=5V,ID=250µA
880 1140
VGS=0V,VDS=25V,f =1MHz See Fig 5 VDD=400V,ID=2A, RG=16 Ω See Fig 13
4 5 OO
VDS=640V,VGS=10V, ID=2A See Fig 6 & Fig 12
4 5 OO
Source-Drain Diode Ratings and Characteristics
Symbol IS ISM VSD trr Qrr Characteristic Continuous Source Current Pulsed-Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
1 O 4 O
Min. Typ. Max. Units --------430 4.06 2.8 18 1.4 --A V ns µC
Test Condition Integral reverse pn-diode in the MOSFET TJ=25 C,IS=2.8A,VGS=0V TJ=25 C,IF=4.5A diF/dt=100A/µs
4 O
Ο Ο
Notes ; 1 O Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature 2 O L=75mH, I AS=2.8A, VDD=50V, RG=27Ω, Starting T J =25 C _ _ _ 3 O ISD <4.5A, di/dt <120A/ µs, VDD
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