Advanced Power MOSFET



Part  Number SSP6N70A
Manufacturer Fairchild
Semiconductor DataSheet

DataSheet View

Advanced Power MOSFET FEATURES Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area Lower Leakage Current : 25 µA (Max.) @ VDS = 700V Low RDS(ON) : 1.552 Ω (Typ.) 1 2 3 SSP6N70A BVDSS = 700 V RDS(on) = 1.8 Ω ID = 6 A TO-220 1.Gate 2. Drain 3. Source Absolute Maximum Ratings Symbol VDSS ID IDM VGS EAS IAR EAR dv/dt PD TJ , TSTG TL Characteristic Drain-to-Source Voltage Continuous Drain Current (TC=25 C ) Continuous Drain Current (TC=100 C) Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TC=25 C) Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8“ from case for 5-seconds Ο Ο Ο Value 700 6 3.8 24 1 O 2 O 1 O 1 O 3 O Units V A A V mJ A mJ V/ns W W/ C Ο 582 6 13 2.5 130 1.04 - 55 to +150 Ο C 300 Thermal Resistance Symbol R θJC R θCS R θJA Characteristic Junction-to-Case Case-to-Sink Junction-to-Ambient Typ. -0.5 -Max. 0.96 -62.5 Ο Units C/W Rev. B ©1999 Fairchild Semiconductor Corporation SSP6N70A Electrical Characteristics (TC=25 C unless otherwise specified) Ο N-CHANNEL POWER MOSFET Symbol BVDSS ∆BV/∆TJ VGS(th) IGSS IDSS RDS(on) gfs Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Characteristic Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff. Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse Drain-to-Source Leakage Current Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain(“ Miller” ) Charge Min. Typ. Max. Units 700 -2.0 -----------------0.79 ------4.12 100 45 18 23 76 26 51 8.3 23.1 --4.0 100 -100 25 250 1.8 -115 55 45 55 160 60 67 --nC ns µA Test Condition VGS=0V,ID=250 µA See Fig 7 VDS=5V,ID=250 µA VGS=30V VGS=-30V VDS=700V VDS=560V,TC=125 C VGS=10V,ID=3A VDS=50V,ID=3A 4 O* 4 O Ο V Ο V/ C ID=250 µA V nA Ω Ω pF 920 1200 VGS=0V,VDS=25V,f =1MHz See Fig 5 VDD=350V,ID=6A, RG=11.5Ω See Fig 13 VDS=560V,VGS=10V, ID=6A See Fig 6 & Fig 12 4 5 OO 4 5 OO Source-Drain Diode Ratings and Characteristics Symbol IS ISM VSD trr Qrr Characteristic Continuous Source Current Pulsed-Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge 1 O 4 O Min. Typ. Max. Units --------440 4.05 6 24 1.4 --A V ns µC Test Condition Integral reverse pn-diode in the MOSFET TJ=25 C,IS=6A,VGS=0V TJ=25 C,IF=6A diF/dt=100A/µs Ο Ο 4 O Notes ; 1 O Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature 2 O L=30mH, I AS=6A, VDD=50V, RG=27Ω, Starting T J =25 C 3 _ _ _ O ISD < 6A, di/dt <140A/ µs, VDD



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