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Part Number |
SSP6N70A |
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Manufacturer |
Fairchild |
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Semiconductor DataSheet |
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DataSheet View |
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Advanced Power MOSFET
FEATURES
Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area Lower Leakage Current : 25 µA (Max.) @ VDS = 700V Low RDS(ON) : 1.552 Ω (Typ.)
1 2 3
SSP6N70A
BVDSS = 700 V RDS(on) = 1.8 Ω ID = 6 A
TO-220
1.Gate 2. Drain 3. Source
Absolute Maximum Ratings
Symbol VDSS ID IDM VGS EAS IAR EAR dv/dt PD TJ , TSTG TL Characteristic Drain-to-Source Voltage Continuous Drain Current (TC=25 C ) Continuous Drain Current (TC=100 C) Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TC=25 C) Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8“ from case for 5-seconds
Ο Ο Ο
Value 700 6 3.8 24
1 O 2 O 1 O 1 O 3 O
Units V A A V mJ A mJ V/ns W W/ C
Ο
582 6 13 2.5 130 1.04 - 55 to +150
Ο
C
300
Thermal Resistance
Symbol R θJC R θCS R θJA Characteristic Junction-to-Case Case-to-Sink Junction-to-Ambient Typ. -0.5 -Max. 0.96 -62.5
Ο
Units
C/W
Rev. B
©1999 Fairchild Semiconductor Corporation
SSP6N70A
Electrical Characteristics (TC=25 C unless otherwise specified)
Ο
N-CHANNEL POWER MOSFET
Symbol BVDSS ∆BV/∆TJ VGS(th) IGSS IDSS RDS(on) gfs Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd
Characteristic Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff. Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse Drain-to-Source Leakage Current Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain(“ Miller” ) Charge
Min. Typ. Max. Units 700 -2.0 -----------------0.79 ------4.12 100 45 18 23 76 26 51 8.3 23.1 --4.0 100 -100 25 250 1.8 -115 55 45 55 160 60 67 --nC ns
µA
Test Condition VGS=0V,ID=250 µA See Fig 7 VDS=5V,ID=250 µA VGS=30V VGS=-30V VDS=700V VDS=560V,TC=125 C VGS=10V,ID=3A VDS=50V,ID=3A
4 O* 4 O
Ο
V
Ο
V/ C ID=250 µA V nA
Ω Ω
pF
920 1200
VGS=0V,VDS=25V,f =1MHz See Fig 5 VDD=350V,ID=6A, RG=11.5Ω See Fig 13 VDS=560V,VGS=10V, ID=6A See Fig 6 & Fig 12
4 5 OO 4 5 OO
Source-Drain Diode Ratings and Characteristics
Symbol IS ISM VSD trr Qrr Characteristic Continuous Source Current Pulsed-Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
1 O 4 O
Min. Typ. Max. Units --------440 4.05 6 24 1.4 --A V ns µC
Test Condition Integral reverse pn-diode in the MOSFET TJ=25 C,IS=6A,VGS=0V TJ=25 C,IF=6A diF/dt=100A/µs
Ο Ο
4 O
Notes ; 1 O Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature 2 O L=30mH, I AS=6A, VDD=50V, RG=27Ω, Starting T J =25 C 3 _ _ _ O ISD < 6A, di/dt <140A/ µs, VDD
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