SSH10N60A (Fairchild) - BV(dss): 600V / R(ds): 0.8Ohm / I(d): 10A / advanced power MOSFET (SSH10N60A.pdf)

Fairchild

Description
Advanced Power MOSFET FEATURES Avalanche Rugged Technology Rugged Gate Oxide Technology Lower Input Capacitance Improved Gate Charge Extended Safe Operating Area Lower Leakage Current : 25 µA (Max.) @ VDS = 600V Low RDS(ON) : 0.646 Ω (Typ.) SSH10N60A BVDSS = 600 V RDS(on) = 0.8 Ω ID = 10 A TO-3P 1 2 3 1.Gate 2. Drain 3. Source Absolute Maximum Ratings Symbol VDSS ID IDM VGS EAS IAR EAR dv/dt PD TJ , TSTG TL Characteristic Drain-to-Source Voltage Continuous Drain Current (TC=25 C ) Continuous Drain Current (TC=100 oC ) Drain Current-Pulsed Gate-to-Source Voltage Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (TC=25oC ) Linear Derating Factor Operating Junction and Storage Temperature Range Maximum Lead Temp. for Soldering Purposes, 1/8 “ from case for 5-seconds 1 O o Value 600 10 6.3 40 + 30 _ 545 10 19.3 3.0 193 1.54 - 55 to +150 Units V A A V mJ A mJ V/ns W W/ oC O 1 O 1 O 3 O 2 o C 300 Thermal Resistance Symbol R R θJC θCS Characteristic Junction-to-Case Case-to-Sink Junction-to-Ambient Typ. -0.24 -- Max. 0.65 -40 Units o C /W R θJA Rev. B ©1999 Fairchild Semiconductor Corporation SSH10N60A Symbol BVDSS ∆BV/∆TJ VGS(th) IGSS IDSS RDS(on) gfs Ciss Coss Crss td(on) tr td(off) tf Qg Qgs Qgd Characteristic Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coeff. Gate Threshold Voltage Gate-Source Leakage , Forward Gate-Source Leakage , Reverse Drain-to-Source Leakage Current Static Drain-Source On-State Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain( “Miller “) Charge Min. Typ. Max. Units 600 -2.0 -----------------0.66 ------8.5 190 78 20 23 85 30 74 12 35.4 --4.0 100 -100 25 250 0.8 -220 90 50 55 180 70 95 --nC ns µA Ω Ω pF V V nA N-CHANNEL POWER MOSFET Electrical Characteristics (TC=25oC unless otherwise specified) Test Condition VGS=0V,ID=250µ A See Fig 7 VDS=5V,ID=250 µA VGS=30V VGS=-30V VDS=600V VDS=480V,TC=125 C VGS=10V,ID=5A VDS=50V,ID=5A 4 O 4 O o V/ oC ID=250 µ A 1750 2270 VGS=0V,VDS=25V,f =1MHz See Fig 5 VDD=300V,ID=10A, RG=6.2 Ω See Fig 13 VDS=480V,VGS=10V, ID=10A See Fig 6 & Fig 12 4 5 OO 4 5 OO Source-Drain Diode Ratings and Characteristics Symbol IS ISM VSD trr Qrr Characteristic Continuous Source Current Pulsed-Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge 1 O Min. Typ. Max. Units --------440 4.7 10 40 1.4 --A V ns µC Test Condition Integral reverse pn-diode in the MOSFET TJ=25oC,IS=10A,VGS=0V TJ=25oC,IF=10A diF/dt=100A/µ s 4 O O 4 Notes ; 1 O Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature 2 O L=10mH, I AS=10A, VDD=50V, RG=27Ω, Starting T J =25ooC _ _ _ 3 O ISD <10A, di/dt <150A/ µs, VDD <BVDSS , Starting T J =25 C _ 4 O Pulse Test : Pulse Width = 250 µs, Duty Cycle < 2% 5 Essentially Independent of Operating Temperature O N-CHANNEL POWER MOSFET Fig 1. Output Characteristics [A] Top : 15V 10 V 8.0 V 7.0 V 6.0 V 5.5 V 5.0 V Bottom : 4.5 V SSH10N60A Fig 2. Transfer Characteristics [A] ID , Drain Current 101 VGS 101 ID , Drain Current 150 oC 100 25 oC @ Notes : 1. V = 0 V GS 2. V = 50 V DS - 55 oC 3. 250 µs Pulse Test 6 8 10 100 @ Notes : 1. 250 µs Pulse Test 2. T = 25 oC C 10-1 10-1 100 101 10-1 2 4 VDS , Drain-Source Voltage [V] [A] VGS , Gate-Source Voltage [V] Fig 3. On-Resistance vs. Drain Current RDS(on) , [ ] Ω Drain-Source On-Resistance 20 . Fig 4. Source-Drain Diode Forward Voltage IDR , Reverse Drain Current 15 . V = 10 V GS 11 0 10 . 10 0 05 . VGS = 20 V 1 0 oC 5 2 oC 5 1 -1 0 02 . 04 . 06 . 08 . @Nts: oe 1 VGS = 0 V . 2 2 0 µs P l e T s . 5 us et 10 . 12 . 14 . @ N t : TJ = 2 oC oe 5 00 . 0 10 20 30 4 0 ID , Drain Current [A] VSD , Source-Drain Voltage [V] Fig 5. Capacitance vs. Drain-Source Voltage 30 00 Ciss= Cgs+ C ( Cds= s o t d ) hre gd Coss= Cds+ C gd Fig 6. Gate Charge vs. Gate-Source Voltage [V] 2 V =10V DS 1 0 VDS = 3 0 V 0 VDS = 4 0 V 8 [pF] C iss 20 00 VGS , Gate-Source Voltage Crss= Cgd Capacitance 5 10 00 C oss C rss @Nts: oe 1 V =0V . GS 2 f=1Mz . H @ N t s : ID = 1 . A oe 00 0 0 2 0 4 0 6 0 8 0 00 10 1 10 VDS , Drain-Source Voltage [V] QG , Total Gate Charge [nC] SSH10N60A BVDSS , (Normalized) Drain-Source Breakdown Voltage N-CHANNEL POWER MOSFET Fig 8. On-Resistance vs. Temperature RDS(on) , (Normalized) Drain-Source On-Resistance 3.0 Fig 7. Breakdown Voltage vs. Temperature 1.2 2.5 1.1 2.0 1.0 1.5 1.0 @ Notes : 1. V = 10 V GS 2. I = 5.0 A D 0.9 @ Notes : 1. V = 0 V GS 2. I = 250 µA D 0.5 0.8 -75 -50 -25 0 25 50 75 100 125 150 175 0.0 -75 -50 -25 0 25 50 75 100 125 150 175 TJ , Junction Temperature [ oC] TJ , Junction Temperature [ oC] Fig 9. Max. Safe Operating Area [A] 2 10 Fig 10. Max. Drain Current vs. Case Temperature 12 Operation in This Area is Limited by R DS(on) 100 µs 10 µs [A] 10 ID , Drain Current ID , Drain Current 8 1 10 1 ms 10 ms DC 6 0 10 4 @ Notes : 1. T = 25 oC C 2. T = 150 oC J 3. Single Pulse 2 10-1 0 10 1 10 2 10 3 10 0 25 50 75 100 125 150 VDS , Drain-Source Voltage [V] Tc , Case Temperature [ oC] Fig 11. Thermal Response 100 Thermal Response D=0.5 @ Notes : 1. Zθ J C (t)=0.65 0.2 10- 1 0.1 0.05 0.02 0.01 10- 2 single pulse o C/W Max. 2. Duty Factor, D=t /t2 1 3. TJ M -TC =PD M *Zθ J C (t) ZθJC(t) , PDM t1 t2 10- 5 10- 4 10- 3 10- 2 10- 1 100 101 t 1 , Square Wave Pulse Duration [sec] N-CHANNEL POWER MOSFET Fig 12. Gate Charge Test Circuit & Waveform SSH10N60A “ Current Regulator ” 50K 12V 200nF 300nF Same Type as DUT VGS Qg 10V VDS VGS DUT 3mA Qgs Qgd R1 Current Sampling (IG) Resistor R2 Current Sampling (ID) Resistor Charge Fig 13. Resistive Switching Test Circuit & Waveforms RL Vout Vin RG DUT 10V Vin 10% Vout VDD ( 0.5 rated VDS ) 90% td(on) t on tr td(off) t off tf Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms LL VDS Vary tp to obtain required peak ID BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD BVDSS IAS C VDD VDD tp ID RG DUT 10V tp ID (t) VDS (t) Time N-CHANNEL POWER MOSFET Fig 12. Gate Charge Test Circuit & Waveform SSH10N60A “ Current Regulator ” 50K 12V 200nF 300nF Same Type as DUT VGS Qg 10V VDS VGS DUT 3mA Qgs Qgd R1 Current Sampling (IG) Resistor R2 Current Sampling (ID) Resistor Charge Fig 13. Resistive Switching Test Circuit & Waveforms RL Vout Vin RG DUT 10V Vin 10% Vout VDD ( 0.5 rated VDS ) 90% td(on) t on tr td(off) t off tf Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms LL VDS Vary tp to obtain required peak ID BVDSS 1 EAS = ---- LL IAS2 -------------------2 BVDSS -- VDD BVDSS IAS C VDD VDD tp ID RG DUT 10V tp ID (t) VDS (t) Time TRADEMARKS The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. ACEx™ CoolFET™ CROSSVOLT™ E2CMOSTM FACT™ FACT Quiet Series™ FAST® FASTr™ GTO™ HiSeC™ DISCLAIMER ISOPLANAR™ MICROWIRE™ POP™ PowerTrench™ QS™ Quiet Series™ SuperSOT™-3 SuperSOT™-6 SuperSOT™-8 TinyLogic™ UHC™ VCX™ FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. Preliminary First Production No Identification Needed Full Production Obsolete Not In Production This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.

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SSH10N60A

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