(LH0070 / LH0071) Precision BCD Buffered Reference

Part  Number LH0070
Manufacturer National Semiconductor
Semiconductor DataSheet

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www.DataSheet4U.com LH0070 Series Precision BCD Buffered Reference LH0071 Series Precision Binary Buffered Reference July 1987 LH0070 Series Precision BCD Buffered Reference LH0071 Series Precision Binary Buffered Reference General Description The LH0070 and LH0071 are precision three terminal voltage references consisting of a temperature compensated zener diode driven by a current regulator and a buffer amplifier The devices provide an accurate reference that is virtually independent of input voltage load current temperature and time The LH0070 has a 10 000V nominal output to provide equal step sizes in BCD applications The LH0071 has a 10 240V nominal output to provide equal step sizes in binary applications The output voltage is established by trimming ultra-stable low temperature drift thin film resistors under actual operating circuit conditions The devices are shortcircuit proof in both the current sourcing and sinking directions The LH0070 and LH0071 series combine excellent long term stability ease of application and low cost making them ideal choices as reference voltages in precision D to A and A to D systems Features Y Y Y Y Y Y Y Y Accuracy output voltage LH0070 10V g 0 02% LH0071 10 24V g 0 02% Single supply operation 11 4V to 40V Low output impedance 0 2X Excellent line regulation 0 1 mV V Low zener noise 20 mVp-p 3-lead TO-5 (pin compatible with the LM109) Short circuit proof Low standby current 3 mA Equivalent Schematic Connection Diagram TO-5 Metal Can Package TL H 5550 – 7 TL H 5550 – 1 Order Number LH0070-0H LH0071-0H LH0070-1H LH0071-1H LH0070-2H or LH0071-2H See NS Package Number H03B Typical Applications Statistical Voltage Standard Output Voltage Fine Adjustment TL H 5550 – 9 TL H 5550 – 8 Note The output of the LH0070 and LH0071 may be adjusted to a precise voltage by using the above circuit since the supply current of the devices is relatively small and constant with temperature and input voltage For the circuit shown supply sensitivities are degraded slightly to 0 01% V change in VOUT for changes in VIN and Vb An additional temperature drift of 0 0001% C is added due to the variation of supply current with temperature of the LH0070 and LH0071 Sensitivity to the value of R1 R2 and R3 is less than 0 001% % C1995 National Semiconductor Corporation TL H 5550 RRD-B30M115 Printed in U S A www.DataSheet4U.com Absolute Maximum Ratings If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications (Note 4) Supply Voltage Power Dissipation (See Curve) 40V 600 mW Short Circuit Duration Output Current Operating Temperature Range Storage Temperature Range Lead Temp (Soldering 10 seconds) Continuous g 20 mA b 55 C to a 125 C b 65 C to g 150 C 300 C Electrical Characteristics (Note 1) Parameter Output Voltage LH0070 LH0071 Output Accuracy b0 b1 b2 Output Accuracy b0 b1 b2 Output Voltage Change With Temperature b0 b1 b2 Line Regulation b0 b1 b2 Input Voltage Range Load Regulation Quiescent Current Change In Quiescent Current Output Noise Voltage Ripple Rejection Output Resistance Long Term Stability b0 b1 b2 Thermal Resistance ija (Junction to Ambient) ijc (Junction to Case) TA e 25 C (Note 3) g0 2 g 0 05 Conditions TA e 25 C Min Typ 10 000 10 24 Max Units V V TA e 25 C g 0 03 g 0 02 g0 1 g 0 05 % % % % TA eb55 C 125 C g0 3 g0 2 (Note 2) g0 2 g 0 02 g 0 01 g0 1 g 0 04 % % % % % V % mA mA mVp-p % Vp-p 13VsVINs33V TC e 25 C 0 02 0 01 RL e 50 kX 0 mAsIOUTs5 mA 13VsVINs33V IOUT e 0 mA DVIN e 20V From 23V To 33V BW e 0 1 Hz To 10 Hz TA e 25 C f e 120 Hz 1 11 4 0 01 3 0 75 20 0 01 02 06 01 0 03 40 0 03 5 15 X % yr % yr C W C W Tj e 150 C 200 100 Note 1 Unless otherwise specified these specifications apply for VIN e 15 0V RL e 10 kX and over the temperature range of b 55 C s TA s a 125 C Note 2 This specification is the difference in output voltage measured at TA e 85 C and TA e 25 C or TA e 25 C and TA eb 25 C with readings taken after test chamber and device-under-test stabilization at temperature using a suitable precision voltmeter Note 3 This parameter is guaranteed by design and not tested Note 4 Refer to the following RETS drawings for military specifications RETS0070-0H for LH0070-0H RETS0071-0H for LH0071-0H RETS0070-1H for LH0070-1H RETS0071-1H for LH0071-1H RETS0070-2H for LH0070-2H RETS0071-2H for LH0071-2H 2 www.DataSheet4U.com Typical Performance Characteristics Maximum Power Dissipation Quiescent Current vs Input Voltage Normalized Output Voltage vs Temperature Step Load Response Output Short Circuit Characteristics TL H 5550 – 2 Noise Voltage TL H 5550 – 6 Typical Applications (Continued) Expanded Scale AC Voltmeter TL H 5550 – 4 3 www.DataSheet4U.com Typical Applications (Continued) Dual Output Bench Power Supply Precision Process Control Interface Negative 10V Reference Boosted Reference For Low Input Voltages TL H 5550 – 5 4 www.DataSheet4U.com 5 www.DataSheet4U.com LH0070 Series Precision BCD Buffered Reference LH0071 Series Precision Binary Buffered Reference Physical Dimensions inches (millimeters) Metal Can Package (H) Order Number LH0070-0H LH0071-0H LH0070-1H LH0071-1H LH0070-2H or LH0071-2H NS Package Number H03B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which (a) are intended for surgical implant into the body or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user National Semiconductor Corporation 1111 West Bardin Road Arlington TX 76017 Tel 1(800) 272-9959 Fax 1(800) 737-7018 2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness National Semiconductor Europe Fax (a49) 0-180-530 85 86 Email cnjwge tevm2 nsc com Deutsch Tel (a49) 0-180-530 85 85 English Tel (a49) 0-180-532 78 32 Fran ais Tel (a49) 0-180-532 93 58 Italiano Tel (a49) 0-180-534 16 80 National Semiconductor Hong Kong Ltd 13th Floor Straight Block Ocean Centre 5 Canton Rd Tsimshatsui Kowloon Hong Kong Tel (852) 2737-1600 Fax (852) 2736-9960 National Semiconductor Japan Ltd Tel 81-043-299-2309 Fax 81-043-299-2408 National does not assume any responsibility for use of any circuitry described no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications




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