(K4Y50024UC - K4Y50164UC) 512Mbit XDR TM DRAM

Part  Number K4Y50164UC
Manufacturer Samsung semiconductor
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www.DataSheet4U.com K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM 512Mbit XDR TM DRAM(C-die) Revision 1.1 August 2006 INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS, AND IS SUBJECT TO CHANGE WITHOUT NOTICE. NOTHING IN THIS DOCUMENT SHALL BE CONSTRUED AS GRANTING ANY LICENSE, EXPRESS OR IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IN SAMSUNG PRODUCTS OR TECHNOLOGY. ALL INFORMATION IN THIS DOCUMENT IS PROVIDED ON AS "AS IS" BASIS WITHOUT GUARANTEE OR WARRANTY OF ANY KIND. 1. For updates or additional information about Samsung products, contact your nearest Samsung office. 2. Samsung products are not intended for use in life support, critical care, medical, safety equipment, or similar applications where Product failure could result in loss of life or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. * Samsung Electronics reserves the right to change products or specification without notice. XDR is a trademark of Rambus Inc. 1 of 76 Rev. 1.1 August 2006 K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM Change History Revision 1.0 1.1 Month December August Year 2005 2006 History - First Copy - Based on the Rambus XDRTM DRAM Datasheet Version 0.88 - Add comment on page 5 - Add TMIN on Table13, page 57 2 of 76 Rev. 1.1 August 2006 K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM 0.0 Overview The XDR DRAM device is a general-purpose high-performance memory device suitable for use in a broad range of applications, including computer memory, graphics, video, and any other application where high bandwidth and low latency are required. The 512Mb XDR DRAM device is a CMOS DRAM organized as 32M words by 16bits. The use of Differential Rambus Signaling Level(DRSL) technology permits 4000/3200/2400 Mb/s transfer rates while using conventional system and board design technologies. XDR DRAM devices are capable of sustained data transfers up to 8000 MB/s. XDR DRAM device architecture allows the highest sustained bandwidth for multiple, interleaved randomly addressed memory transactions. The highly-efficient protocol yields over 95% utilization while allowing fine access granuarity. The device’s eight banks support up to four interleaved transactions. 1.0 Features ♦ Highest pin bandwidth available - 4000/3200/2400 Mb/s Octal Data Rate(ODR) Signaling ♦ Bi-directional differential RSL(DRSL) - Flexible read/write bandwidth allocation - Minimum pin count ♦ On-chip termination - Adaptive impedance matching - Reduced system cost and routing complexity ♦ Highest sustained bandwidth per DRAM device - Up to 8000 MB/s sustained data rate - Eight banks : bank-interleaved transaction at full bandwidth - Dynamic request scheduling - Early-read-after-write support for maximum efficiency - Zero overhead refresh ♦ Low Latency - 2.0/2.5/3.33ns request packets - Point-to-point data interconnect for fastest possible flight time - Support for low-latency, fast-cycle cores ♦ Low Power - 1.8V VDD - Programmable small-swing I/O signaling(DRSL) - Low power PLL/DLL design - Powerdown self-refresh support - Per pin I/O powerdown for narrow-width operation ♦ 0.49us refresh intervals(32K/16ms refresh) ♦ RoHS compliant 3 of 76 Rev. 1.1 August 2006 K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM 2.0 Key Timing Parameters/Part Numbers Organization Bandwidth (1/tBIT)a 2400 32Mx16 3200 4000 2400 64Mx8 3200 4000 2400 128Mx4 3200 4000 2400 256Mx2 3200 4000 Latency(tRAC)b 36 35 28 36 35 28 36 35 28 36 35 28 Binc A B C A B C A B C A B C Part Number K4Y50164UC-JCA2 K4Y50164UC-JCB3 K4Y50164UC-JCC4 K4Y50084UC-JCA2 K4Y50084UC-JCB3 K4Y50084UC-JCC4 K4Y50044UC-JCA2 K4Y50044UC-JCB3 K4Y50044UC-JCC4 K4Y50024UC-JCA2 K4Y50024UC-JCB3 K4Y50024UC-JCC4 a.Data rate measured in Mbit/s per DQ differential pair. See “Timing Conditions” on page 58 and “ Timing Characteristics” on page 60. Note that tBIT=tCYCLE/8 b.Read access time tRAC (= tRCD-R+tCAC) measured in ns. See “Timing Parameters” on page 61. c.Timing parameter bin. See “Timing Parameters” on page 61. This is a measure of the number of interleaved read transactions needed for maximum efficiency (the value Ceiling(tRC-R/tRR-D). For bin A, tRC-R/tRR-D=4, and for bin B, tRC-R/tRR-D=5 for bin C, tRC-R/tRR-D =6. 4 of 76 Rev. 1.1 August 2006 K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM 3.0 General Description The timing diagrams in Figure 1 illustrate XDR DRAM device write and read transactions. There are three sets of pins used for normal memory access transactions: CFM/CFMN clock pins, RQ11..0 request pins, and DQ15..0/DQN15..0 data pins. The “N” appended to a signal name denotes the complementary signal of a differential pair. A transaction is a collection of packets needed to complete a memory access. A packet is a set of bit windows on the signals of a bus. There are two buses that carry packets: the RQ bus and DQ bus. Each packet on the RQ bus uses a set of 2 bit-windows on each signal, while the DQ bus uses a set of 16 bit-windows on each signal. In the write transaction shown in Figure 1, a request packet (on the RQ bus) at clock edge T0 contains an activate (ACT) command. This causes row Ra of bank Ba in the memory component to be loaded into the sense amp array for the bank. A second request packet at clock edge T1 contains a write (WR) command. This causes the data packet D(a1) at edge T4 to be written to column Ca1 of the sense amp array for bank Ba. A third request packet at clock edge T3 contains another write (WR) command. This causes the data packet D(a2) at edge T6 to also be written to column Ca2. A final request packet at clock edge T13 contains a precharge (PRE) command. The spacings between the request packets are constrained by the following timing parameters in the diagram: tRCD-W , tCC , and tWRP . In addition, the spacing between the request packets and data packets is constrained by the tCWD parameter. The spacing of the CFM/ CFMN clock edges is constrained by tCYCLE. Figure 1 : XDR DRAM Device Write and Read Transactions T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 T23 CFM CFMN WR RQ11..0 ACT WR a0 a1 a2 tRCD-W tCC DQ15..0 tCWD DQN15..0 tWRP D(a1) D(a2) a0 = {Ba,Ra} a1 = {Ba,Ca1} a2 = {Ba,Ca2} a3 = {Ba} Write Transaction T0 T1 T2 T3 T4 T5 T6 T7 T8 T9 T10 T11 T12 T13 T14 T15 T16 T17 T18 T19 T20 T21 T22 T23 CFM CFMN RQ11..0 ACT a0 DQ15..0 DQN15..0 tRCD-R RD a1 tCC RD a2 tRDP PRE a3 Q(a1) Q(a2) a2 = {Ba,Ca2} a3 = {Ba} Read Transaction The read transaction shows a request packet at clock edge T0 containing an ACT command. This causes row Ra of bank Ba of the memory component to load into the sense amp array for the bank. A second request packet at clock edge T5 contains a read (RD) command. This causes the data packet Q(a1) at edge T11 to be read from column Ca1 of the sense amp array for bank Ba. A third request packet at clock edge T7 contains another RD command. This causes the data packet Q(a2) at edge T13 to also be read from column Ca2. A final request packet at clock edge T10 contains a PRE command. The spacings between the request packets are constrained by the following timing parameters in the diagram: tRCD-R , tCC , and tRDP . In addition, the spacing between the request and data packets are constrained by the tCAC parameter. * Any system or application incorporating random access memory products should be properly designed, tested and qualified to ensure proper use or access of such memory products. Disproportionate, excessive and/or repeated access to a particular address or addresses may result in reduction of product life. tCYCLE PRE a3 tCYCLE Transaction a: WR tCAC Transaction a: RD a0 = {Ba,Ra} a1 = {Ba,Ca1} 5 of 76 Rev. 1.1 August 2006 K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM 4.0 Pinouts and Definitions The following table shows the pin assignment of 512Mb x16 XDR DRAM Package. The mechanical dimensions of this package are shown on page 72. Note - Pin #1 is at the A1 postion. Table 1-1 : x16 Package Pinout(Top View) : 104ball FBGA Package 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 Top View ROW COL DQ10 DQN10 DQ6 DQN6 VDD GND DQ0 DQN0 DQ12 DQN12 GND VTERM SDO RST GND VDD GND VDD RQ2 RQ1 VDD GND RQ5 VREF VDD GND GND VDD RQ6 RQ7 VDD VDD RQ8 RQ9 GND GND SCK CMD VDD GND DQ1 DQN1 DQ13 DQN13 GND VTERM DQ11 DQN11 DQ7 DQN7 VDD GND GND VDD DQ14 DQN14 DQ2 DQN2 A GND VDD DQ4 DQN4 DQ8 DQN8 B VTERM GND RQ0 GND SDI C VDD RQ3 RQ4 VDD D VDD RSRV RSRV GND E GND VDD GND CFMN CFM VDD GND VTERM RQ11 RQ10 GND H GND VDD VDD VDD J GND VDD DQ5 DQN5 DQ9 DQN9 K GND VDD DQ15 DQN15 DQ3 DQN3 L F G SAMSUNG SAMSUNG 520 401 040 K4Y50164UC- JCC4 K4Y5017UM - JCB3 K4R PC Top View Chip The pin #1(ROW1, COLA) is located at the A1 position on the top side and the A1 position is marked by the marker “ ”. 6 of 76 Rev. 1.1 August 2006 K4Y50164UC K4Y50084UC K4Y50044UC K4Y50024UC XDRTM DRAM The following table shows the pin assignment of 512Mb x8 XDR DRAM Package. The mechanical dimensions of this package are shown on page 72. Note - Pin #1 is at the A1 postion. Table 1-2 : x8 Package Pinout(Top View) : 104ball FBGA Package 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 Top View ROW COL RSRV RSRV DQ6 DQN6 VDD GND DQ0 DQN0 RSRV RSRV GND VTERM SDO RST GND VDD GND VDD RQ2 RQ1 VDD GND RQ5 VREF VDD GND GND VDD RQ6 RQ7 VDD VDD RQ8 RQ9 GND GND SCK CMD VDD GND DQ1 DQN1 RSRV RSRV GND VTERM RSRV RSRV DQ7 DQN7 VDD GND GND VDD RSRV RSRV DQ2 DQN2 A GND VDD DQ4 DQN4 RSRV RSRV B VTERM GND RQ0 GND SDI C VDD RQ3 RQ4 VDD D VDD RSRV RSRV GND E GND VDD GND CFMN CFM VDD GND VTERM RQ11 RQ10 GND H GND VDD VDD VDD J GND VDD DQ5 DQN5 RSRV RSRV K GND VDD RSRV RSRV DQ3 DQN3 L F G SAMSUNG SAMSUNG 520 401 040 K4Y50084UC JCC4 K4Y50164UC - PC K4Y5017UM JCB3 K4R Top View Chip The pin #1(ROW1, COLA) is located a




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