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Part Number |
K15H50C |
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Manufacturer |
Toshiba |
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Semiconductor DataSheet |
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DataSheet View |
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TK15H50C
TOSHIBA Field Effect Transistor Silicon N-Channel MOS Type (π-MOS VI)
TK15H50C
○ Switching Regulator Applications
• • • • Low drain−source ON resistance Low leakage current Enhancement mode : RDS (ON) = 0. 33 Ω (typ.) High forward transfer admittance : |Yfs| = 8.5 S (typ.) : IDSS = 100 µA (max) (VDS = 500 V) : Vth = 2.0~4.0 V (VDS = 10 V, I45D = 1 mA) Unit: mm
Absolute Maximum Ratings (Ta = 25°C)
Characteristic Drain−source voltage Drain−gate voltage (RGS = 20 kΩ) Gate−source voltage Drain current DC (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating 500 500 ±30 15 60 150 765 15 15 150 −55~150 Unit V V V A A W mJ A mJ °C °C
Pulse (Note 1)
1: GATE 2: DRAIN (HEAT SINK) 3: SOURCE JEDEC JEITA TOSHIBA Weight: 3.8 g (typ.) ― ―
Drain power dissipation (Tc = 25°C) Single-pulse avalanche energy (Note 2)
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Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Thermal Characteristics
2
Characteristic Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch−c) Rth (ch−a) Max 0.833 50 Unit °C/W °C/W
Note 1: Ensure that the channel temperature does not exceed 150°C. Note 2: VDD = 90 V, Tch = 25°C (initial), L = 5.78 mH, RG = 25 Ω, IAR = 15 A Note 3: Repetitive rating: pulse width limited by maximum channel temperature This transistor is an electrostatic-sensitive device. Handle with care.
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TK15H50C
Electrical Characteristics (Ta = 25°C)
Characteristic Gate leakage current Gate−source breakdown voltage Drain cutoff current Drain−source breakdown voltage Gate threshold voltage Drain−source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Symbol IGSS V (BR) GSS IDSS V (BR) DSS Vth RDS (ON) |Yfs| Ciss Crss Coss tr ton tf toff Qg Qgs Qgd VDD ≈ 400 V, VGS = 10 V, ID = 15 A VDS = 25 V, VGS = 0 V, f = 1 MHz Test Condition VGS = ±25 V, VDS = 0 V IG = ±10 µA, VDS = 0 V VDS = 500 V, VGS = 0 V ID = 10 mA, VGS = 0 V VDS = 10 V, ID = 1 mA VGS = 10 V, ID = 7.0 A VDS = 10 V, ID = 7.0 A Min — ±30 — 500 2.0 — 4.0 — — — — Typ. — — — — — 0.33 8.5 2450 15 220 50 Max ±10 — 100 — 4.0 0.4 — — — — — pF Unit µA V µA V V Ω S
Turn-on time Switching time Fall time
—
90
— ns
—
45
—
Turn-off time Total gate charge (gate−source plus gate−drain) Gate−source charge
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— — — —
175 48 26 22
— — — — nC
Gate−drain (“Miller”) charge
Source−Drain Ratings and Characteristics (Ta = 25°C)
Characteristic Continuous drain reverse current (Note 1) Pulse drain reverse current (Note 1) Forward voltage (diode) Reverse recovery time Reverse recovery charge Symbol IDR IDRP VDSF trr Qrr Test Condition — — IDR = 15 A, VGS = 0 V IDR = 15 A, VGS = 0 V dIDR / dt = 100 A / µs Min — — — — — Typ. — — — 1050 13 Max 15 60 −1.7 — — Unit A A V ns µC
Marking
TOSHIBA
TK15H50C
Part No. (or abbreviation code) Lot No. A line indicates a lead (Pb)-free package or lead (Pb)-free finish.
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TK15H50C
ID – VDS
10 Common source Tc = 25°C Pulse test 10 8 6 20 10
ID – VDS
Common source Tc = 25°C Pulse test
Drain current ID (A)
6 5.25 4 5 2 4.75 4.5 VGS = 4 V 0 0 1 2 3 4 5
Drain current ID (A)
8
16
12
6 5.75
8 5.5 5.25 4 5 4.75 4.5 0 0 10 20 30 VGS = 4 V 40 50
Drain−source voltage
VDS (V)
Drain−source voltage
VDS (V)
ID – VGS
50 Common source VDS = 20 V Pulse test 10 Tc = −55°C
VDS – VGS
Common source Tc = 25°C Pulse test
Drain current ID (A)
40
(V)
8 25
VDS Drain−source voltage
6 15 4 8 2 ID = 4 A 0 0
30 100 20
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10
0
0
2
4
6
8
10
4
8
12
16
20
Gate−source voltage VGS
(V)
Gate−source voltage VGS
(V)
⎪Yfs⎪ − ID (S)
100 1 Common source VDS = 20 V Pulse test Common source Tc = 25°C Pulse test
RDS (ON) − ID
Forward transfer admittance ⎪Yfs⎪
Tc = −55°C 25 10 100
Drain−source ON resistance RDS (ON) (Ω)
VGS = 10 V
15
1 1
10
100
0.1 0.1
1
10
100
Drain current ID (A)
Drain current ID (A)
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TK15H50C
RDS (ON) – Tc
1.0
IDR − VDS
100 Common source Tc = 25°C Pulse test
0.8
Drain reverse current IDR (A)
Drain−source ON resistance RDS (ON) (Ω)
Common source VGS = 10 V Pulse test
10
0.6 ID = 15 A 0.4 8 4 0.2
1
10 5 3 1 VGS = 0, −1 V −0.6 −0.8 −1.0 −1.2
0 −80
−40
0
40
80
120
160
0.1 0
−0.2
−0.4
Case temperature
Tc (°C)
Drain−source voltage
VDS (V)
Capacitance – VDS
10000 5 Ciss
Vth − Tc Gate threshold voltage Vth (V)
(pF)
4
1000
Capacitance C
3
Coss
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2
100 Common source VGS = 0 V f = 1 MHz Tc = 25°C 10 0.1 1 10
1
Crss 100
0 −80
Common source VDS = 10 V ID = 1 mA Pulse test −40 0 40 80 120 160
Drain−source voltage
VDS
(V)
Case temperature
Tc
(°C)
PD − Tc
200 500
Dynamic input/output characteristics VDS (V)
Common source ID = 15 A Tc = 25°C Pulse test VDS 20
PD
150
400
400
16
Drain−source voltage
Drain power dissipation
300
VDS = 100 V 200
400
12
100
200
200
8
50
100
VGS VDS = 100 V
4
0
0 0 40 80 120 160 200
0
20
40
60
80
0 100
Case temperature
Tc
(°C)
Total gate charge
Qg (nC)
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Gate−source voltage VGS (V)
(W)
TK15H50C
rth − tw
10
Normalized transient thermal impedance
1
rth (t)/Rth (ch-c)
Duty = 0.5
0.2 0.1 0.1 0.05 0.02 SINGLE PULSE 0.01 10μ 0.01 100μ 1m 10m 100m PDM t T Duty = t/T Rth (ch-c) = 0.833°C/W 1 10
Pulse width
tw
(s)
SAFE OPERATING AREA
1000 1000
EAS – Tch
100
ID max (pulse) * ID max (continuous) 100 µs *
EAS (mJ) Avalanche energy
1000
800
ID
(A)
10
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Drain current
DC OPERATION Tc = 25°C
1 ms *
600
1
400
* Single pulse Ta = 25℃ 0.1 Curves must be derated linearly with increase in temperature. 1 10
200
VDSS max 0 25
0.01 100
50
75
100
125
150
Drain-source voltage
VDS (V)
Channel temperature (initial) Tch
(°C)
15 V −15 V
BVDSS IAR VDD Test circuit Waveform
Ε AS = ⎛ ⎞ 1 B VDSS ⎟ ⋅ L ⋅ I2 ⋅ ⎜ ⎜B 2 − VDD ⎟ ⎝ VDSS ⎠
VDS
RG = 25 Ω VDD = 90 V, L = 5.78 mH
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