SMPS MOSFET

Part  Number IRFPS29N60L
Manufacturer International Rectifier
Semiconductor DataSheet

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PD - 94622 SMPS MOSFET IRFPS29N60L HEXFET® Power MOSFET Applications • Zero Voltage Switching SMPS VDSS RDS(on) typ. Trr typ. ID • Telecom and Server Power Supplies • Uninterruptible Power Supplies 175mΩ 600V 130ns 29A • Motor Control applications Features and Benefits • SuperFast body diode eliminates the need for external diodes in ZVS applications. • Lower Gate charge results in simpler drive requirements. • Enhanced dv/dt capabilities offer improved ruggedness. • Higher Gate voltage threshold offers improved noise immunity . Super-247™ Absolute Maximum Ratings Parameter ID @ TC = 25°C Continuous Drain Current, VGS @ 10V ID @ TC = 100°C Continuous Drain Current, VGS @ 10V IDM Pulsed Drain Current PD @TC = 25°C Power Dissipation Max. 29 18 110 480 3.8 ±30 12 -55 to + 150 300 (1.6mm from case ) 1.1(10) N•m (lbf•in) W W/°C V V/ns °C Units A ™ VGS dv/dt TJ TSTG Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Operating Junction and d Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 screw Diode Characteristics Symbol IS ISM VSD trr Qrr IRRM ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Min. Typ. Max. Units ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 130 240 630 9.4 29 A 110 1.5 190 360 950 14 V ns Conditions MOSFET symbol showing the integral reverse p-n junction diode. TJ = 25°C, IS = 29A, VGS = 0V TJ = 25°C, IF = 29A TJ = 125°C, di/dt = 100A/µs Ãc Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Reverse Recovery Current Forward Turn-On Time f 1820 2720 nC TJ = 25°C, IS = 29A, VGS = 0V TJ = 125°C, di/dt = 100A/µs A TJ = 25°C f f f 1 2/6/03 Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) www.irf.com IRFPS29N60L Static @ TJ = 25°C (unless otherwise specified) Symbol V(BR)DSS ∆V(BR)DSS/∆TJ RDS(on) VGS(th) IDSS IGSS RG Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Internal Gate Resistance Min. Typ. Max. Units 600 ––– ––– 3.0 ––– ––– ––– ––– ––– ––– 0.53 175 ––– ––– ––– ––– ––– 0.86 ––– ––– 210 5.0 50 2.0 100 -100 ––– Ω V mΩ V µA mA nA Conditions VGS = 0V, ID = 250µA VGS = 10V, ID = 17A V/°C Reference to 25°C, ID = 1mA f VDS = VGS, ID = 250µA VDS = 600V, VGS = 0V VDS = 480V, VGS = 0V, TJ = 125°C VGS = 30V VGS = -30V f = 1MHz, open drain Dynamic @ TJ = 25°C (unless otherwise specified) Symbol gfs Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Coss eff. Coss eff. (ER) Parameter Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Effective Output Capacitance Effective Output Capacitance (Energy Related) Min. Typ. Max. Units 15 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 34 100 66 54 6160 530 44 250 190 ––– 220 67 96 ––– ––– ––– ––– ––– ––– ––– ––– ––– pF ns nC S ID = 29A Conditions VDS = 50V, ID = 17A VDS = 480V VGS = 10V, See Fig. 7 & 15 VDD = 300V ID = 29A RG = 4.3Ω VGS = 10V, See Fig. 11a & 11b VGS = 0V VDS = 25V ƒ = 1.0MHz, See Fig. 5 VGS = 0V,VDS = 0V to 480V f f g Avalanche Characteristics Symbol EAS IAR EAR Parameter Single Pulse Avalanche Energy Avalanche Current Ù d Typ. ––– ––– ––– Max. 570 29 48 Units mJ A mJ Repetitive Avalanche Energy ™ Thermal Resistance Symbol RθJC RθCS RθJA Parameter Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. ––– 0.24 ––– Max. 0.26 ––– 40 Units °C/W Notes:  Repetitive rating; pulse width limited by max. junction temperature. (See Fig. 11) ‚ Starting TJ = 25°C, L = 1.5mH, RG = 25Ω, IAS = 29A. (See Figure 12a) ƒ ISD ≤ 29A, di/dt ≤ 560A/µs, VDD ≤ V(BR)DSS, TJ ≤ 150°C. „ Pulse width ≤ 300µs; duty cycle ≤ 2%. … Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% V DSS . Coss eff.(ER) is a fixed capacitance that stores the same energy as Coss while VDS is rising from 0 to 80% V DSS . 2 www.irf.com IRFPS29N60L 1000 TOP VGS 15V 10V 9.0V 7.0V 7.0V 5.5V 5.0V 4.5V 20µs PULSE WIDTH Tj = 25°C ID, Drain-to-Source Current (A) 100 TOP VGS 15V 10V 9.0V 7.0V 7.0V 5.5V 5.0V 4.5V ID, Drain-to-Source Current (A) 100 10 BOTTOM 10 BOTTOM 1 1 4.5V 0.1 4.5V 0.01 0.1 1 10 100 0.1 0.1 1 20µs PULSE WIDTH Tj = 150°C 10 100 VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000.00 3.0 RDS(on) , Drain-to-Source On Resistance ID = 28A 2.5 ID, Drain-to-Source Current (Α) 100.00 VGS = 10V T J = 150°C 10.00 2.0 (Normalized) 1.5 1.00 T J = 25°C 1.0 0.10 VDS = 50V 20µs PULSE WIDTH 0.01 4 6 8 10 0.5 0.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 VGS , Gate-to-Source Voltage (V) T J , Junction Temperature (°C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature www.irf.com 3 IRFPS29N60L 100000 VGS = 0V, f = 1 MHZ Ciss = C gs + Cgd, C ds SHORTED Crss = Cgd Coss = Cds + Cgd 40 35 30 Energy (µJ) 10000 C, Capacitance(pF) Ciss 25 20 15 10 1000 Coss 100 Crss 10 1 10 100 1000 5 0 0 100 200 300 400 500 600 700 VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) Fig 5. Typical Capacitance vs. Drain-to-Source Voltage Fig 6. Typ. Output Capacitance Stored Energy vs. VDS 20 VGS , Gate-to-Source Voltage (V) 1000.00 ID= 28A ISD, Reverse Drain Current (A) 16 VDS= 480V VDS= 300V VDS= 150V 100.00 12 T J = 150°C 10.00 8 4 1.00 T J = 25°C 0 0 40 80 120 160 200 240 0.10 0.2 0.4 0.6 0.8 1.0 1.2 VGS = 0V Q G Total Gate Charge (nC) 1.4 1.6 VSD, Source-to-Drain Voltage (V) Fig 7. Typical Gate Charge vs. Gate-to-Source Voltage Fig 8. Typical Source-Drain Diode Forward Voltage 4 www.irf.com IRFPS29N60L 1000 OPERATION IN THIS AREA LIMITED BY R DS(on) ID, Drain Current (A) 30 ID, Drain-to-Source Current (A) 25 100 20 10 100µsec 1msec 15 10 1 Tc = 25°C Tj = 150°C Single Pulse 0.1 1 10 100 1000 10000 VDS, Drain-to-Source Voltage (V) 5 10msec 0 25 50 75 100 125 150 T C , Case Temperature (°C) Fig 9. Maximum Safe Operating Area Fig 10. Maximum Drain Current vs. Case Temperature VDS VGS RG 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % RD VDS 90% D.U.T. + -VDD 10% VGS td(on) tr t d(off) tf Fig 11a. Switching Time Test Circuit Fig 11b. Switching Time Waveforms www.irf.com 5 IRFPS29N60L 1 Thermal Response ( Z thJC ) D = 0.50 0.1 0.20 0.10 0.05 0.01 0.02 0.01 SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 12. Maximum Effective Transient Thermal Impedance, Junction-to-Case 5.0 VGS(th) Gate threshold Voltage (V) 4.0 ID = 250µA 3.0 2.0 1.0 -75 -50 -25 0 25 50 75 100 125 150 T J , Temperature ( °C ) Fig 13. Threshold Voltage vs. Temperature 6 www.irf.com IRFPS29N60L 1200 EAS , Single Pulse Avalanche Energy (mJ) 1000 ID TOP 13A 18A BOTTOM 29A 800 600 400 200 0 25 50 75 100 125 150 Starting T J , Junction Temperature (°C) Fig 14a. Maximum Avalanche Energy vs. Drain Current 15V V(BR)DSS VDS L DRIVER tp RG 20V D.U.T IAS tp + - VDD A 0.01Ω I AS Fig 14b. Unclamped Inductive Test Circuit Current Regulator Same Type as D.U.T. Fig 14c. Unclamped Inductive Waveforms 50KΩ 12V .2µF .3µF QG VGS V D.U.T. + V - DS QGS VG QGD VGS 3mA IG ID Current Sampling Resistors Charge Fig 15a. Gate Charge Test Circuit Fig 15b. Basic Gate Charge Waveform www.irf.com 7 IRFPS29N60L Peak Diode Recovery dv/dt Test Circuit D.U.T + ƒ + Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer ‚ - „ +  RG • • • • dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test + VDD Driver Gate Drive P.W. Period D= P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt VDD Re-Applied Voltage Inductor Curent Body Diode Forward Drop Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 16. For N-Channel HEXFET® Power MOSFETs 8 www.irf.com IRFPS29N60L Super-247™ (TO-274AA) Package Outline 0.13 [.005] 16.10 [.632] 15.10 [.595] 5.50 [.216] 4.50 [.178] 2.15 [.084] 1.45 [.058] 0.25 [.010] B A 2X R 3.00 [.118] 2.00 [.079] A 13.90 [.547] 13.30 [.524] 1.30 [.051] 0.70 [.028] 20.80 [.818] 19.80 [.780] 4 16.10 [.633] 15.50 [.611] 4 C 1 2 3 B Ø 1.60 [.063] MAX. E E 14.80 [.582] 13.80 [.544] 4.25 [.167] 3.85 [.152] 5.45 [.215] 2X 3X 1.60 [.062] 1.45 [.058] B A 3X 1.30 [.051] 1.10 [.044] 0.25 [.010] S ECT ION E-E NOT ES : 1. DIMENSIONING AND T OLERANCING PER ASME Y14.5M-1994. 2. DIMENSIONS ARE S HOWN IN MILLIMET ERS [INCHES] 3. CONT ROLLING DIMENSION: MILLIMET ER 4. OUT LINE CONFORMS T O JEDEC OUT LINE T O-274AA 2.35 [.092] 1.65 [.065] LEAD ASS IGNMENT S MOS FET 1 - GAT E 2 - DRAIN 3 - S OURCE 4 - DRAIN IGBT 1 - GAT E 2 - COLLECT OR 3 - EMIT T ER 4 - COLLECT OR Super-247™ (TO-274AA)Part Marking Information EXAMPLE: THIS IS AN IRFPS37N50A WITH ASSEMBLY LOT CODE A8B9 INTERNATIONAL RECTIFIER LOGO ASSEMBLY LOT CODE IRFPS37N50A PART NUMBER A8B9 0020 DATE CODE (YYWW) YY = YEAR WW = WEE




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