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Part Number |
54AC20 |
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Manufacturer |
National Semiconductor |
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Semiconductor DataSheet |
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DataSheet View |
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54AC20 Dual 4-Input NAND Gate
July 1998
54AC20 Dual 4-Input NAND Gate
General Description
The ’AC20 contains four 4-input NAND gates. n Outputs source/sink 24 mA n Standard Military Drawing (SMD) n ’AC20: 5962-87613
Features
n ICC reduced by 50%
Logic Symbol
IEEE/IEC
DS100264-1
Pin Names An, Bn, Cn, Dn On Inputs
Description Outputs
Connection Diagrams
Pin Assignment for DIP and Flatpak Pin Assignment for LCC
DS100264-3
DS100264-2
FACT™ is a trademark of Fairchild Semiconductor Corporation.
© 1998 National Semiconductor Corporation
DS100264
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Supply Voltage (VCC) DC Input Diode Current (IIK) VI = −0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = −0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) −0.5V to +7.0V −20 mA +20 mA −0.5V to VCC + 0.5V −20 mA +20 mA −0.5V to VCC + 0.5V
Junction Temperature (TJ) CDIP
175˚C
Recommended Operating Conditions
Supply Voltage (VCC) ’AC Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) 54AC Minimum Input Edge Rate (∆V/∆t) ’AC Devices VIN from 30% to 70% of VCC VCC @ 3.3V, 4.5V, 5.5V 2.0V to 6.0V 0V to VCC 0V to VCC −55˚C to +125˚C
± 50 mA ± 50 mA −65˚C to +150˚C
125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. National does not recommend operation of FACT™ circuits outside databook specifications.
DC Characteristics for ’AC Family Devices
Symbol Parameter VCC (V) 54AC TA = −55˚C to +125˚C Guaranteed Limits VIH Minimum High Level Input Voltage VIL Maximum Low Level Input Voltage VOH Minimum High Level Output Voltage 3.0 4.5 5.5 3.0 4.5 5.5 3.0 4.5 5.5 2.1 3.15 3.85 0.9 1.35 1.65 2.9 4.4 5.4 (Note 2) VIN = VIL or VIH 3.0 4.5 5.5 VOL Maximum Low Level Output Voltage 3.0 4.5 5.5 2.4 3.7 4.7 0.1 0.1 0.1 (Note 2) VIN = VIL or VIH 3.0 4.5 5.5 IIN IOLD IOHD Maximum Input Leakage Current Minimum Dynamic Output Current (Note 3) 5.5 5.5 50 −50 mA mA VOLD = 1.65V Max VOHD = 3.85V Min 5.5 0.5 0.5 0.5 V µA IOL = 12 mA IOL = 24 mA IOL = 24 mA VI = VCC, GND V V IOH = −12 mA IOH = −24 mA IOH = −24 mA IOUT = 50 µA V IOUT = −50 µA V VOUT = 0.1V or VCC − 0.1V V VOUT = 0.1V or VCC − 0.1V Units Conditions
± 1.0
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DC Characteristics for ’AC Family Devices
Symbol Parameter VCC (V)
(Continued)
54AC TA = −55˚C to +125˚C Guaranteed Limits
Units
Conditions
ICC
Maximum Quiescent Supply Current
5.5
40.0
µA
VIN = VCC or GND
Note 2: All outputs loaded; thresholds on input associated with output under test. Note 3: Maximum test duration 2.0 ms, one output loaded at a time. Note 4: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC. ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C.
AC Electrical Characteristics
VCC Symbol Parameter (V) (Note 5) Min tPLH tPHL Propagation Delay Propagation Delay 3.3 5.0 3.3 5.0
Note 5: Voltage Range 3.3 is 3.3V ± 0.3V Voltage Range 5.0 is 5.0V ± 0.5V
54AC TA = −55˚C to +125˚C CL = 50 pF Max 11.0 8.5 10.0 7.0 ns ns 1.0 1.0 1.0 1.0 Units
Capacitance
Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 40.0 Units pF pF Conditions VCC = OPEN VCC = 5.0V
3
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Physical Dimensions
inches (millimeters) unless otherwise noted
20 Terminal Ceramic Leadless Chip Carrier (L) NS Package Number E20A
14 Lead Ceramic Dual-In-Line Package (D) NS Package Number J14A
5
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54AC20 Dual 4-Input NAND Gate
Physical Dimensions
inches (millimeters) unless otherwise noted (Continued)
14 Lead Ceramic Flatpak (F) NS Package Number W14B
LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user.
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National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
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