Quad Buffer

www.DataSheet4U.com 54AC 74AC125  74ACT125 Quad Buffer with TRI-STATE Outputs March 1993 54AC 74AC125  74ACT125 Quad Buffer with TRI-STATE Outputs General Description The ’AC ’ACT125 contains four independent non-inverting buffers with TRI-STATE outputs Features Y Y Y ICC reduced by 50% Outputs source sink 24 mA ’ACT125 has TTL-compatible outputs Logic Symbol IEEE IEC Connection Diagrams Pin Assignment for DIP SOIC and Flatpak Pin Assignment for LCC TL F 10692–1 TL F 10692 – 2 TL F 10692 – 3 Pin Names An Bn On Description Inputs Outputs Function Table Inputs An L L H Bn L H X Output On L H Z H e HIGH Voltage Level L e LOW Voltage Level Z e HIGH Impedance X e Immaterial TRI-STATE is a registered trademark of National Semiconductor Corporation FACTTM is a trademark of National Semiconductor Corporation C1995 National Semiconductor Corporation TL F 10692 RRD-B30M75 Printed in U S A Absolute Maximum Ratings (Note 1) If Military Aerospace specified devices are required please contact the National Semiconductor Sales Office Distributors for availability and specifications Supply Voltage (VCC) DC Input Diode Current (IK) VI e b0 5V VI e VCC a 0 5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO e b0 5V VO e VCC a 0 5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) Junction Temperature (TJ) CDIP PDIP b 0 5V to a 7 0V b 20 mA a 20 mA b 0 5V to VCC a 0 5V b 20 mA a 20 mA b 0 5V to VCC a 0 5V g50 mA g50 mA Recommended Operating Conditions Supply Voltage (VCC) ’AC ’ACT Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) 74AC ACT 54AC ACT Minimum Input Edge Rate (DV Dt) ’AC Devices VIN from 30% to 70% of VCC VCC 3 3V 4 5V 5 5V Minimum Input Edge Rate (DV Dt) ’ACT Devices VIN from 0 8V to 2 0V VCC 4 5V 5 5V 2 0V to 6 0V 4 5V to 5 5V 0V to VCC 0V to VCC b 40 C to a 85 C b 55 C to a 125 C 125 mV ns b 65 C to a 150 C 125 mV ns 175 C 140 C Note 1 Absolute maximum ratings are those values beyond which damage to the device may occur The databook specifications should be met without exception to ensure that the system design is reliable over its power supply temperature and output input loading variables National does not recommend operation of FACT TM circuits outside databook specifications DC Characteristics for ’AC Family Devices 74AC Symbol Parameter VCC (V) TA e a 25 C Typ VIH Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage 30 45 55 30 45 55 30 45 55 30 45 55 VOL Maximum Low Level Output Voltage 30 45 55 30 45 55 IIN Maximum Input Leakage Current 55 0 002 0 001 0 001 15 2 25 2 75 15 2 25 2 75 2 99 4 49 5 49 21 3 15 3 85 09 1 35 1 65 29 44 54 2 56 3 86 4 86 01 01 01 0 36 0 36 0 36 g0 1 54AC TA e b 55 C to a 125 C 74AC TA e b 40 C to a 85 C Units Conditions Guaranteed Limits 21 3 15 3 85 09 1 35 1 65 29 44 54 24 37 47 01 01 01 0 50 0 50 0 50 g1 0 21 3 15 3 85 09 1 35 1 65 29 44 54 2 46 3 76 4 76 01 01 01 0 44 0 44 0 44 g1 0 V VOUT e 0 1V or VCC b 0 1V VOUT e 0 1V or VCC b 0 1V IOUT e b50 mA VIL V VOH V VIN e VIL or VIH b 12 mA b 24 mA IOH b 24 mA IOUT e 50 mA V VIN e VIL or VIH 12 mA IOL 24 mA 24 mA VI e VCC GND V V mA All outputs loaded thresholds on input associated with output under test 2 DC Characteristics for ’AC Family Devices (Continued) 74AC Symbol Parameter VCC (V) TA e a 25 C Typ IOZ Maximum TRI-STATE Current Minimum Dynamic Output Current Maximum Quiescent Supply Current 55 55 55 55 40 g0 5 54AC TA e b 55 C to a 125 C 74AC TA e b 40 C to a 85 C Units Conditions Guaranteed Limits g10 0 g5 0 mA mA mA mA VI (OE) e VIL VIH VI e VCC VGND VO e VCC GND VOLD e 1 65V Max VOHD e 3 85V Min VIN e VCC or GND IOLD IOHD ICC 50 b 50 75 b 75 80 0 40 0 Maximum test duration 2 0 ms one output loaded at a time Note IIN and ICC ICC for 54AC 3 0V are guaranteed to be less than or equal to the respective limit 25 C is identical to 74AC 25 C 5 5V VCC DC Characteristics for ’ACT Family Devices 74ACT Symbol Parameter VCC (V) TA e a 25 C Typ VIH VIL VOH Minimum High Level Input Voltage Maximum Low Level Input Voltage Minimum High Level Output Voltage 45 55 45 55 45 55 45 55 VOL Maximum Low Level Output Voltage 45 55 45 55 IIN IOZ ICCT IOLD IOHD ICC Maximum Input Leakage Current Maximum TRI-STATE Current Maximum ICC Input Minimum Dynamic Output Current Maximum Quiescent Supply Current 55 55 55 55 55 55 40 06 0 001 0 001 15 15 15 15 4 49 5 49 74ACT TA e b 40 C to a 85 C Units Conditions Guaranteed Limits 20 20 08 08 44 54 3 86 4 86 01 01 0 36 0 36 g0 1 g0 5 20 20 08 08 44 54 3 76 4 76 01 01 0 44 0 44 g1 0 g5 0 V V V VOUT e 0 1V or VCC b 0 1V VOUT e 0 1V or VCC b 0 1V IOUT e b50 mA VIN e VIL or VIH b 24 mA IOH b 24 mA IOUT e 50 mA VIN e VIL or VIH 24 mA 24 mA V V V mA mA mA mA mA mA IOL VI e VCC GND VI e VIL VIH VO e VCC GND VI e VCC b 2 1V VOLD e 1 65V Max VOHD e 3 85V Min VIN e VCC or GND 15 75 b 75 40 0 All outputs loaded thresholds on input associated with output under test Maximum test duration 2 0 ms one output loaded at a time May be measured per the JEDEC Alternate Method 3 AC Electrical Characteristics 74AC Symbol Parameter VCC (V) Min tPLH tPHL tPZH tPZL tPHZ tPLZ Propagation Delay Data to Output Propagation Delay Data to Output Output Enable Time Output Enable Time Output Disable Time Output Disable Time 33 50 33 50 33 50 33 50 33 50 33 50 10 10 10 10 10 10 10 10 10 10 10 10 TA e a 25 C CL e 50 pF Typ 65 55 65 50 60 50 75 55 75 65 75 65 Max 90 70 90 70 10 5 70 10 0 80 10 0 90 10 5 90 54AC TA e b55 C to a 125 C CL e 50 pF Min Max 74AC TA e b40 C to a 85 C CL e 50 pF Min 10 10 10 10 10 10 10 10 10 10 10 10 Max 10 0 75 10 0 75 11 0 80 11 0 85 10 5 95 11 5 95 ns ns ns ns ns ns Units Voltage Range 3 3 is 3 3V g0 3V Voltage Range 5 0 is 5 0V g0 5V AC Electrical Characteristics 74ACT Symbol Parameter VCC (V) Min tPLH tPHL tPZH tPZL tPHZ tPLZ Propagation Delay Data to Output Propagation Delay Data to Output Output Enable Time Output Enable Time Output Disable Time Output Disable Time 50 50 50 50 50 50 10 10 10 10 10 10 TA e a 25 C CL e 50 pF Typ 65 70 60 70 70 75 Max 90 90 85 95 95 10 0 74ACT TA e b40 C to a 85 C CL e 50 pF Min 10 10 10 10 10 10 Max 10 0 10 0 95 10 5 10 5 10 5 ns ns ns ns ns ns Units Voltage Range 5 0 is 5 0V g0 5V Capacitance Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance AC ACT Typ 45 45 0 pF pF VCC e OPEN VCC e 5 0V Units Conditions 4 Ordering Information The device number is used to form part of a simplified purchasing code where the package type and temperature range are defined as follows 74AC Temperature Range Family 74AC e Commercial 54AC e Military 74ACT e Commercial TTL-Compatible Device Type Package Code P e Plastic DIP D e Ceramic DIP F e Flatpak L e Leadless Ceramic Chip Carrier (LCC) S e Small Outline (SOIC) 125 P C QR Special Variations Xe Devices shipped in 13 reels QR e Commercial grade device with burn-in QB e Military grade device with environmental and burn-in processing shipped in tubes Temperature Range C e Commercial (b40 C to a 85 C) M e Military (b55 C to a 125 C) 5 Physical Dimensions inches (millimeters) 20 Terminal Ceramic Leadless Chip Carrier (L) NS Package Number E20A 14-Lead Ceramic Dual-In-Line Package (D) NS Package Number J14A 6 Physical Dimensions inches (millimeters) (Continued) 14-Lead Small Outline Integrated Circuit (S) NS Package Number M14A 14-Lead Plastic Dual-In-Line Package (P) NS Package Number N14A 7 54AC 74AC125  74ACT125 Quad Buffer with TRI-STATE Outputs Physical Dimensions inches (millimeters) (Continued) 14-Lead Ceramic Flatpak (F) NS Package Number W14B LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which (a) are intended for surgical implant into the body or (b) support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user National Semiconductor Corporation 2900 Semiconductor Drive P O Box 58090 Santa Clara CA 95052-8090 Tel 1(800) 272-9959 TWX (910) 339-9240 National Semiconductor GmbH Livry-Gargan-Str 10 D-82256 F4urstenfeldbruck Germany Tel (81-41) 35-0 Telex 527649 Fax (81-41) 35-1 National Semiconductor Japan Ltd Sumitomo Chemical Engineering Center Bldg 7F 1-7-1 Nakase Mihama-Ku Chiba-City Ciba Prefecture 261 Tel (043) 299-2300 Fax (043) 299-2500 2 A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system or to affect its safety or effectiveness National Semiconductor Hong Kong Ltd 13th Floor Straight Block Ocean Centre 5 Canton Rd Tsimshatsui Kowloon Hong Kong Tel (852) 2737-1600 Fax (852) 2736-9960 National Semiconductores Do Brazil Ltda Rue Deputado Lacorda Franco 120-3A Sao Paulo-SP Brazil 05418-000 Tel (55-11) 212-5066 Telex 391-1131931 NSBR BR Fax (55-11) 212-1181 National Semiconductor (Australia) Pty Ltd Building 16 Business Park Drive Monash Business Park Nottinghill Melbourne Victoria 3168 Australia Tel (3) 558-9999 Fax (3) 558-9998 National does not assume any responsibility for use of any circuitry described no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications