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SCANPSC110F Fairchild Semiconductor SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port

Description The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a board from the system and retain test access to the remaining modules. Each SCANPSC110F Bridge supports up to 3 local scan rings which can be accessed individually or comb...
Features s True IEEE1149.1 hierarchical and multidrop addressable capability s The 6 slot inputs support up to 59 unique addresses, a Broadcast Address, and 4 Multi-cast Group Addresses s 3 IEEE 1149.1-compatible configurable local scan ports s Mode Register allows local TAPs to be bypassed, selected for insertion into the scan chain individually, or serial...

Datasheet PDF File SCANPSC110F Datasheet - 273.25KB

SCANPSC110F  






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