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Analog Devices Semiconductor Electronic Components Datasheet

AD53500 Datasheet

High Speed/ High Current Capability Pin Driver

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AD53500 pdf
a
FEATURES
–2 V to +6 V Output Range
2.5 Output Resistance
2.5 ns Tr/Tf for a 3 V Step
300 MHz Toggle Rate
Can Drive 25 Lines and Lower
Peak Dynamic Current Capability of 400 mA
Inhibit Leakage <1 A
On-Chip Temperature Sensor
APPLICATIONS
Automatic Test Equipment
Semiconductor Test Systems
Board Test Systems
Instrumentation and Characterization Equipment
High Speed, High Current
Capability Pin Driver
AD53500
FUNCTIONAL BLOCK DIAGRAM
VH
DATA
DATA
INH
INH
VL
VCC
VCC
VEE
VEE
39nF
39nF
DRIVER
2
VHDCPL
VOUT
AD53500
1.0A/K
VLDCPL
TVCC
THERM
GND GND GND GND GND
PRODUCT DESCRIPTION:
The AD53500 is a complete high speed driver designed for use
in digital or mixed signal test systems where high speed and high
output drive capabilities are needed. Combining a high speed
monolithic process and a unique surface mount package, this
product attains superb electrical performance while preserving
optimum packing densities and long-term reliability thanks to an
ultrasmall 20-lead, PSOP package with built-in heat sink.
High and low reference levels can be set within a –2 V to +6 V
range with low offset voltage and high gain accuracy. A 2.5
output resistance allows use of an external backmatch resistor for
application to 50 , 25 or other complex impedance load
requirements. Without a backmatch resistor it is also capable of
driving highly capacitive loads, typically achieving a rise/fall time
of less than 10 ns with a 1000 pF capacitance. To test I/O
devices, the pin driver can be switched into a high impedance
state (Inhibit Mode), electrically removing the driver from the
path. The pin driver leakage current in inhibit is typically less
than 1 µA and output capacitance is typically less than 18 pF.
Transitions from HI/LO or to inhibit are controlled through the
data and inhibit inputs. The input circuitry utilizes high-speed
differential inputs with a common-mode range of –2 V to +5 V.
This allows for direct interface to the precision of differential
ECL timing or the simplicity of stimulating the pin driver from a
single-ended CMOS or TTL logic source or any combination
over the common-mode range. The analog logic HI/LO inputs
are equally easy to interface, typically requiring 50 µA of bias
current.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781/329-4700 World Wide Web Site: http://www.analog.com
Fax: 781/326-8703
© Analog Devices, Inc., 1999


Analog Devices Semiconductor Electronic Components Datasheet

AD53500 Datasheet

High Speed/ High Current Capability Pin Driver

No Preview Available !

AD53500 pdf
AD53500–SPECIFICATIONS (All specifications are at TJ = +85؇C ؎ 5؇C, +VS = +10 V ؎ 3%, –VS = +6 V ؎ 3%
unless otherwise noted. All temperature coefficients are measured over TJ = 75؇C–95؇C). (In test figures, voltmeter loading is 1 Mor greater,
scope probe loading is 100 kin parallel with 5 pF.) 39 nF capacitors must be connected between VCC and VHDCPL and between VEE and VLDCPL.
Parameter
DIFFERENTIAL INPUT CHARACTERISTICS
(DATA to DATA, INH to INH)
Common-Mode Input Voltage
Differential Input Range
Bias Current
REFERENCE INPUTS
Bias Currents
OUTPUT CHARACTERISTICS
Logic High Range
Logic Low Range
Amplitude (VH and VL)
Min Typ
–2
ECL or TTL
± 100
–50
+1
–2
0.1
VH, VL Interaction
Absolute Accuracy
VH Offset
VH Gain + Linearity Error
VL Offset
VL Gain + Linearity Error
Offset TC, VH or VL
Output Resistance
–10
–100
–100
1.5
± 0.3 ±5
± 0.3 ±5
0.5
2.5
Dynamic Current Limit
400
Static Current Limit
60
–180
DYNAMIC PERFORMANCE, DRIVE
(VH and VL)
Propagation Delay Time
Propagation Delay TC
Delay Matching, Edge-to-Edge
Rise and Fall Time
1 V Swing
3 V Swing
5 V Swing
Rise and Fall Time TC
1 V Swing
3 V Swing
5 V Swing
Overshoot, Undershoot and Preshoot
Settling Time
to 15 mV
to 4 mV
Delay Change vs. Pulsewidth
2.5
1
100
0.85
2.5
4.0
±1
±2
±3
+5.0 +30
40
8
100
Minimum Pulsewidth
3 V Swing
5 V Swing
Toggle Rate
3.8
5.5
300
Max Units
Test Conditions
+5 Volts
µA
ECL = –0.8 V/–1.8 V, TTL = 0 V/5 V
VCM = –2 V, +5 V
+50 µA
VL, VH = 5 V
+6 Volts
+2 Volts
8 Volts
+10 mV
DATA = H, VL = –2 V, VH = +1 V to +6 V
DATA = L, VL = –2 V to +2 V, VH = +6 V
VL = –0.05 V, VH = +0.05 V and
VL = –2 V, VH = +6 V
100 mV Output Amplitude
+100
+100
5.5
mV
% of VH + mV
mV
% of VL + mV
mV/°C
mA
180 mA
–60 mA
DATA = H, VH = 0 V, VL = –2 V
DATA = H, VL = –2 V, VH = +1 V to +6 V
DATA = L, VL = 0 V, VH = +6 V
DATA = L, VL = –2 V to +2 V, VH = +6 V
VL, VH = 0 V, +5 V and –2 V, 0 V
VH = +3 V, VL = 0 V, IOUT = 0, –30 mA,
+30 mA
CBYP = 39 nF, VH = +5 V, VL = 0 V
CLOAD = 1000 pF, Tr/Tf = 10 ns
Output to –2 V, VH = +6 V, VL = –1 V,
DATA = H and Output to +6 V, VH = +6 V,
VL = –2 V, DATA = L
ns
ps/°C
ps
Measured at 50%, VH = +400 mV,
VL = –400 mV
Measured at 50%, VH = +400 mV,
VL = –400 mV
Measured at 50%, VH = +400 mV,
VL = –400 mV
ns Measured 20%–80%, VL = 0 V, VH = 1 V
ns Measured 10%–90%, VL = 0 V, VH = 3 V
ns Measured 10%–90%, VL = 2 V, VH = 3 V
ps/°C
ps/°C
ps/°C
% of Step + mV
Measured 20%–80%, VL = 0 V, VH = 1 V
Measured 10%–90%, VL = 0 V, VH = 3 V
Measured 10%–90%, VL = 0 V, VH = 5 V
VH–VL = 0.5 V, 1 V, 3 V, 8 V
ns VL = 0 V, VH = 0.5 V
µs VL = 0 V, VH = 0.5 V
ps VL = 0 V, VH = 2 V, Pulsewidth = 2.5 ns/
Period = 10 ns and Pulsewidth = 30 ns/
Period = 120 ns
ns
ns
MHz
VL = 0 V, VH = 3 V, Output = 2.7 V p-p,
Measure at 50%
VL = 0 V, VH = 5 V, Output = 4.5 V p-p,
Measure at 50%
VL = –1.8 V, VH = –0.8 V, VOUT > 600 mV p-p
–2– REV. 0


Part Number AD53500
Description High Speed/ High Current Capability Pin Driver
Maker Analog Devices
Total Page 7 Pages
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